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SN54AC00-SP Datasheet, PDF (1/7 Pages) Texas Instruments – RAD-TOLERANT CLASS V, QUADRUPLE 2-INPUT POSITIVE-NAND GATE
SN54AC00-SP
www.ti.com ............................................................................................................................................................................................. SCHS367 – OCTOBER 2008
RAD-TOLERANT CLASS V, QUADRUPLE 2-INPUT POSITIVE-NAND GATE
FEATURES
1
• 2-V to 6-V VCC Operation
• Inputs Accept Voltages to 6 V
• Max tpd of 7 ns at 5 V
• Rad-Tolerant: 50 KRad(Si) TID (1)
– TID Dose Rate < 2 mRad/sec
• QML-V Qualified, SMD 5962-87549
(1) Radiation tolerance is a typical value based upon initial device qualification. Radiation Lot Acceptance Testing is available - contact
factory for details.
J OR W PACKAGE
(TOP VIEW)
1A 1
1B 2
1Y 3
2A 4
2B 5
2Y 6
GND 7
14 VCC
13 4B
12 4A
11 4Y
10 3B
9 3A
8 3Y
DESCRIPTION/ORDERING INFORMATION
The SN54AC00 device contains four independent 2-input NAND gates. Each gate performs the Boolean function
of Y = A • B or Y = A + B in positive logic.
TA
–55°C to 125°C
CDIP – J
CFP – W
ORDERING INFORMATION
PACKAGE (1) (2)
ORDERABLE PART NUMBER
Tube
5962-8754903VCA
Tube
5962-8754903VDA
TOP-SIDE MARKING
5962-8754903VCA
5962-8754903VDA
(1) Package drawings, thermal data, and symbolization are available at www.ti.com/packaging.
(2) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
website at www.ti.com.
FUNCTION TABLE
(Each Gate)
INPUTS
A
B
H
H
L
X
X
L
OUTPUT
Y
L
H
H
LOGIC DIAGRAM (POSITIVE LOGIC)
A
Y
B
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2008, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are
tested unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.