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SN54AC00-DIE Datasheet, PDF (1/9 Pages) Texas Instruments – RAD-TOLERANT, QUADRUPLE 2-INPUT POSITIVE-NAND GATE
SN54AC00-DIE
www.ti.com
SCHS391 – APRIL 2013
RAD-TOLERANT, QUADRUPLE 2-INPUT POSITIVE-NAND GATE
Check for Samples: SN54AC00-DIE
FEATURES
1
• 2-V to 6-V VCC Operation
• Inputs Accept Voltages to 6 V
• Max tpd of 7 ns at 5 V
DESCRIPTION/ORDERING INFORMATION
The SN54AC00-DIE device contains four independent 2-input NAND gates. Each gate performs the Boolean
function of Y = A • B or Y = A + B in positive logic.
PRODUCT
SN54AC00
PACKAGE
DESIGNATOR
TD
ORDERING INFORMATION(1)
PACKAGE
ORDERABLE PART NUMBER
Bare die in waffle pack(2)
SN54AC00VTD1
SN54AC00VTD2
PACKAGE QUANTITY
100
10
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
(2) Processing is per the Texas Instruments space production baseline and is in compliance with the Texas Instruments Quality Control
System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room temperature
only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not warranted. Visual
Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2013, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are
tested unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.