SN54ABT8646 Datasheet, PDF (1/32 Pages) Texas Instruments – SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND RESISTERS

SN54ABT8646, SN74ABT8646
SCAN TEST DEVICES WITH
OCTAL BUS TRANSCEIVERS AND REGISTERS
SCBS123F − AUGUST 1992 − REVISED APRIL 2004
D Members of the Texas Instruments
SCOPE  Family of Testability Products
D Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and
Boundary-Scan Architecture
D Functionally Equivalent to ’F646 and
’ABT646 in the Normal-Function Mode
D SCOPE  Instruction Set
− IEEE Standard 1149.1-1990 Required
Instructions, Optional INTEST, CLAMP,
and HIGHZ
− Parallel-Signature Analysis at Inputs
With Masking Option
− Pseudorandom Pattern Generation From
Outputs
− Sample Inputs/Toggle Outputs
− Binary Count From Outputs
− Even-Parity Opcodes
D Two Boundary-Scan Cells Per I/O for
Greater Flexibility
D State-of-the-Art EPIC-ΙΙB BiCMOS Design
Significantly Reduces Power Dissipation
D Package Options Include Plastic
Small-Outline (DW) and Shrink
Small-Outline (DL) Packages, Ceramic Chip
Carriers (FK), and Standard Ceramic DIPs
(JT)
description
The ’ABT8646 and scan-test devices with octal
bus transceivers and registers are members of the
Texas Instruments SCOPE testability
integrated-circuit family. This family of devices
supports IEEE Standard 1149.1-1990 boundary
scan to facilitate testing of complex circuit-board
assemblies. Scan access to the test circuitry is
accomplished via the 4-wire test access port
(TAP) interface.
SN54ABT8646 . . . JT PACKAGE
SN74ABT8646 . . . DL OR DW PACKAGE
(TOP VIEW)
CLKAB 1
SAB 2
DIR 3
A1 4
A2 5
A3 6
GND 7
A4 8
A5 9
A6 ¹⁰
A7 11
A8 12
TDO ¹³
TMS ¹⁴
28 CLKBA
27 SBA
26 OE
25 B1
24 B2
23 B3
22 B4
21 V_CC
20 B5
19 _B6
18 B7
17 B8
16 _TDI
15 _TCK
SN54ABT8646 . . . FK PACKAGE
(TOP VIEW)
OE
SBA
CLKBA
CLKAB
SAB
DIR
A1
4 3 2 1 28 27 26
5
25
6
24
7
23
8
22
9
21
10
20
11
19
12 13 14 15 16 17 18
B7
B8
TDI
TCK
TMS
TDO
A8
In the normal mode, these devices are functionally equivalent to the ’F646 and ’ABT646 octal bus transceivers
and registers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing
at the device pins or to perform a self-test on the boundary-test cells. Activating the TAP in normal mode does
not affect the functional operation of the SCOPE octal bus transceivers and registers.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SCOPE and EPIC-ΙΙB are trademarks of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright  2004, Texas Instruments Incorporated
On products compliant to MILĆPRFĆ38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
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