SN54ABT18646 Datasheet, PDF (1/29 Pages) Texas Instruments – SCAN TEST DEVICE WITH 18-BIT TRANSCEIVERS AND REGISTERS

• Members of the Texas Instruments
SCOPE ™ Family of Testability Products
• Members of the Texas Instruments
Widebus ™ Family
• Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and
Boundary-Scan Architecture
• Includes D-Type Flip-Flops and Control
Circuitry to Provide Multiplexed
Transmission of Stored and Real-Time Data
• Two Boundary-Scan Cells per I/O for
Greater Flexibility
• State-of-the-Art EPIC-ΙΙB ™ BiCMOS Design
Significantly Reduces Power Dissipation
SN54ABT18646
SCAN TEST DEVICE WITH
18-BIT TRANSCEIVERS AND REGISTERS
SGBS306 – AUGUST 1992 – REVISED AUGUST 1994
• SCOPE ™ Instruction Set
– IEEE Standard 1149.1-1990 Required
Instructions, Optional INTEST, CLAMP
and HIGHZ
– Parallel-Signature Analysis at Inputs With
Masking Option
– Pseudo-Random Pattern Generation
From Outputs
– Sample Inputs/Toggle Outputs
– Binary Count From Outputs
– Device Identification
– Even-Parity Opcodes
• Packaged in 68-Pin Ceramic Quad Flat
Package
HV PACKAGE
(TOP VIEW)
1A3
1A4
1A5
GND
1A6
1A7
1A8
1A9
NC
V_CC
2A1
2A2
2A3
GND
2A4
2A5
2A6
9 8 7 6 5 4 3 2 1 68 67 66 65 64 63 62 61
10
60
11
59
12
58
13
57
14
56
15
55
16
54
17
53
18
52
19
51
20
50
21
49
22
48
23
47
24
46
25
45
26
44
27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43
1B4
1B5
1B6
GND
1B7
1B8
1B9
V_CC
NC
2B1
2B2
2B3
2B4
GND
2B5
2B6
2B7
NC – No internal connection
SCOPE, Widebus, and EPIC-ΙΙB are trademarks of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
• POST OFFICE BOX 655303 DALLAS, TEXAS 75265
Copyright © 1994, Texas Instruments Incorporated
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