SN54ABT18504 Datasheet, PDF (1/30 Pages) Texas Instruments – SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

• Members of the Texas Instruments
SCOPE ™ Family of Testability Products
• Members of the Texas Instruments
Widebus ™ Family
• Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and
Boundary-Scan Architecture
• UBT ™ (Universal Bus Transceiver)
Combines D-Type Latches and D-Type
Flip-Flops for Operation in Transparent,
Latched, or Clocked Mode
• Two Boundary-Scan Cells per I/O for
Greater Flexibility
• State-of-the-Art EPIC-ΙΙB ™ BiCMOS Design
Significantly Reduces Power Dissipation
SN54ABT18504, SN74ABT18504
SCAN TEST DEVICES WITH
20-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS108B – AUGUST 1992 – REVISED JUNE 1993
• SCOPE ™ Instruction Set
– IEEE Standard 1149.1-1990 Required
Instructions, Optional INTEST, and
P1149.1A CLAMP and HIGHZ
– Parallel Signature Analysis at Inputs With
Masking Option
– Pseudo-Random Pattern Generation
From Outputs
– Sample Inputs/Toggle Outputs
– Binary Count From Outputs
– Device Identification
– Even-Parity Opcodes
• Packaged in 64-Pin Plastic Thin Quad Flat
Pack Using 0.5-mm Center-to-Center
Spacings and 68-Pin Ceramic Quad Flat
Pack Using 25-mil Center-to-Center
Spacings
SN54ABT18504 . . . HV PACKAGE
(TOP VIEW)
A4
A5
A6
GND
A7
A8
A9
A10
NC
V_CC
A11
A12
A13
GND
A14
A15
A16
9 8 7 6 5 4 3 2 1 68 67 66 65 64 63 62 61
10
60
11
59
12
58
13
57
14
56
15
55
16
54
17
53
18
52
19
51
20
50
21
49
22
48
23
47
24
46
25
45
26
44
27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43
B5
B6
B7
GND
B8
B9
B10
V_CC
NC
B11
B12
B13
B14
GND
B15
B16
B17
NC – No internal connection
SCOPE, Widebus, UBT, and EPIC-ΙΙB are trademarks of Texas Instruments Incorporated.
UNLESS OTHERWISE NOTED this document contains PRODUCTION
DATA information current as of publication date. Products conform to
specifications per the terms of Texas Instruments standard warranty.
Production processing does not necessarily include testing of all
parameters.
• POST OFFICE BOX 655303 DALLAS, TEXAS 75265
Copyright © 1993, Texas Instruments Incorporated
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