SN54ABT16853_07 Datasheet, PDF (1/11 Pages) Texas Instruments – DUAL 8-BIT TO 9-BIT PARITY BUS TRANSCEIVERS

SN54ABT16853, SN74ABT16853
DUAL 8-BIT TO 9-BIT PARITY BUS TRANSCEIVERS
SCBS153B – OCTOBER 1992 – REVISED JANUARY 1997
D Members of the Texas Instruments
Widebus ™ Family
D State-of-the-Art EPIC-ΙΙB™ BiCMOS Design
Significantly Reduces Power Dissipation
D Latch-Up Performance Exceeds 500 mA
Per JEDEC Standard JESD-17
D Typical V_OLP (Output Ground Bounce) < 1 V
at V_CC = 5 V, T_A = 25°C
D Distributed V_CC and GND Pin Configuration
Minimizes High-Speed Switching Noise
D Flow-Through Architecture Optimizes
PCB Layout
D High-Drive Outputs (–32-mA I_OH, 64-mA I_OL)
D Parity-Error Flag With Parity
Generator/Checker
D Latch for Storage of the Parity-Error Flag
D Package Options Include Plastic 300-mil
Shrink Small-Outline (DL) and Thin Shrink
Small-Outline (DGG) Packages and 380-mil
Fine-Pitch Ceramic Flat (WD) Package
Using 25-mil Center-to-Center Spacings
description
The ’ABT16853 dual 8-bit to 9-bit parity
transceivers are designed for communication
between data buses. When data is transmitted
from the A bus to the B bus, a parity bit is
generated. When data is transmitted from the
B bus to the A bus, with its corresponding parity
bit, the open-collector parity-error (ERR) output
indicates whether or not an error in the B data has
occurred. The output-enable (OEA and OEB)
inputs can be used to disable the device so that
the buses are effectively isolated. The ’ABT16853
provide true data at the outputs.
SN54ABT16853 . . . WD PACKAGE
SN74ABT16853 . . . DGG OR DL PACKAGE
(TOP VIEW)
1OEB 1
1LE 2
1ERR 3
GND 4
1A1 5
1A2 6
V_CC 7
1A3 8
1A4 9
1A5 10
GND 11
1A6 12
1A7 13
1A8 14
2A1 15
2A2 16
2A3 17
GND 18
2A4 19
2A5 20
2A6 21
V_CC 22
2A7 23
2A8 24
GND 25
2ERR 26
2LE 27
2OEB 28
56 1OEA
55 1CLR
54 1PARITY
53 GND
52 1B1
51 1B2
50 V_CC
49 1B3
48 1B4
47 1B5
46 GND
45 1B6
44 1B7
43 1B8
42 2B1
41 2B2
40 2B3
39 GND
38 2B4
37 2B5
36 2B6
35 V_CC
34 2B7
33 2B8
32 GND
31 2PARITY
30 2CLR
29 2OEA
A 9-bit parity generator/checker generates a parity-odd (PARITY) output and monitors the parity of the I/O ports
with the ERR flag. The parity-error output can be passed, sampled, stored, or cleared from the latch using the
latch-enable (LE) and clear (CLR) control inputs. When both OEA and OEB are low, data is transferred from
the A bus to the B bus, and inverted parity is generated. Inverted parity is a forced error condition that gives the
designer more system diagnostic capability.
To ensure the high-impedance state during power up or power down, OE should be tied to V_CC through a pullup
resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
EPIC-ΙΙB and Widebus are trademarks of Texas Instruments Incorporated.
UNLESS OTHERWISE NOTED this document contains PRODUCTION
DATA information current as of publication date. Products conform to
specifications per the terms of Texas Instruments standard warranty.
Production processing does not necessarily include testing of all
parameters.
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Copyright © 1997, Texas Instruments Incorporated
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