SN28846 Datasheet, PDF (1/9 Pages) Texas Instruments – SERIAL DRIVER

SN28846
SERIAL DRIVER
SOCS024B – FEBRUARY 1991
• TTL-Compatible Inputs
DW PACKAGE
• CCD-Compatible Outputs
(TOP VIEW)
• Full-Frame Operation
• Frame-Transfer Operation
• Solid-State Reliability
SEL0OUT ₁
GND ₂
PD ₃
20 ^V_SS
19 ^SEL0
18 ^NC
• Adjustable Clock Levels
SRG3IN ₄
SRG2IN ₅
17 ^V_CC
16 ^SRG3OUT
description
SRG1IN ₆
15 ^SRG2OUT
The SN28846 serial driver is a monolithic CMOS
integrated circuit designed to drive the serial-reg-
ister gate (SRGn) and transfer-gate (TRG) inputs
of the Texas Instruments (TI™) virtual-phase CCD
TRGIN 7
NC 8
SEL1OUT 9
V_SS 10
14 ^SRG1OUT
13 TRGOUT
12 V_CC
11 SEL1
image sensors. The SN28846 interfaces a
user-defined timing generator to the CCD image
NC – No internal connection
sensor; it receives TTL signals from the timing generator and outputs level-shifted signals to the image sensor.
The SN28846 contains three noninverting serial-gate drivers and one noninverting transfer-gate driver.
The voltage levels on SRG1OUT, SRG2OUT, SRG3OUT, and TRGOUT are controlled by the levels on V_SS and
V_CC. The propagation delays for these outputs are controlled by SEL0 and SEL1. The PD, SRG1IN, SRG2IN,
SRG3IN, and TRGIN are TTL compatible.
A high level on PD allows the SN28846 to operate normally with the level-shifted outputs following the inputs.
When PD is low, the device is in a low power-consumption mode and all outputs are at V_CC.
The SN28846 is available in a 20-pin surface-mount package and is characterized for operation from –20°C
to 45°C.
This device contains circuits to protect its inputs and outputs against damage due to high static voltages or electrostatic fields. These
circuits have been qualified to protect this device against electrostatic discharges (ESD) of up to 2 kV according to MIL-STD-883C,
Method 3015; however, precautions should be taken to avoid application of any voltage higher than maximum-rated voltages to these
high-impedance circuits. During storage or handling, the device leads should be shorted together or the device should be placed in
conductive foam. In a circuit, unused inputs should always be connected to an appropriated logic voltage level, preferably either VCC or ground.
Specific guidelines for handling devices of this type are contained in the publication Guidelines for Handling Electrostatic-Discharge-Sensitive
(ESDS) Devices and Assemblies available from Texas Instruments.
TI is a trademark of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright © 1991, Texas Instruments Incorporated
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