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SN10KHT5578 Datasheet, PDF (1/6 Pages) Texas Instruments – OCTAL TTL-TO-ECL TRANSLATOR WITH D-TYPE EDGE-TRIGGERED FLIP-FLOPS AND OUTPUT ENABLE
SN10KHT5578
OCTAL TTL-TO-ECL TRANSLATOR WITH D-TYPE
EDGE-TRIGGERED FLIP-FLOPS AND OUTPUT ENABLE
SDZS014A – APRIL 1990 – REVISED JANUARY 1999
D 10KH Compatible
D TTL Clock and ECL Control Inputs
D Noninverting Outputs
D Flow-Through Architecture Optimizes PCB
Layout
D Center Pin VCC, VEE, and GND Configurations
Minimize High-Speed Switching Noise
D ESD Protection Exceeds 2000 V Per
MIL-STD-883, Method 3015
D Package Options Include Plastic Small-Outline
(DW) Package and Standard Plastic (NT) DIPs
description
This octal TTL-to-ECL translator is designed to
provide efficient translation between a TTL signal
environment and a 10KH ECL signal environ-
ment. This device is designed specifically to
improve the performance and density of
TTL-to-ECL CPU/bus-oriented functions such as
memory address drivers, clock drivers, and
bus-oriented receivers and transmitters.
DW OR NT PACKAGE
(TOP VIEW)
1Q 1
2Q 2
3Q 3
4Q 4
GND 5
GND 6
GND 7
GND 8
5Q 9
6Q 10
7Q 11
8Q 12
24 1D
23 2D
22 3D
21 4D
20 OE(ECL)
19 VCC
18 VEE
17 CLK(TTL)
16 5D
15 6D
14 7D
13 8D
The eight flip-flops of the ’5578 are edge-triggered D-type flip-flops. On the positive transition of the clock, the
Q outputs are set to the logic levels that were set up at the D inputs.
The output-control input OE does not affect the internal operations of the flip-flops. Old data can be retained
or new data can be entered while the outputs are off.
The SN10KHT5578 is characterized for operation from 0°C to 75°C.
FUNCTION TABLE
INPUTS
OE
CLK
D
OUTPUT
(ECL)
Q
L
↑
L
L
L
↑
H
H
L
L
X
Q0
H
X
X
L
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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Copyright © 1999, Texas Instruments Incorporated
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