OPA627-DIE Datasheet, PDF (1/6 Pages) Texas Instruments – OPA627-DIE Precision High-Speed DIFET Operational Amplifier

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OPA627-DIE
SBOS717 – JULY 2014
OPA627-DIE Precision High-Speed DIFET Operational Amplifier
1 Features
•1 Very-Low Noise
• Unity-Gain Stable
2 Applications
• Precision Instrumentation
• Fast Data Acquisition
• DAC Output Amplifier
• Optoelectronics
• Sonar, Ultrasound
• High-Impedance Sensor Amplifiers
• High-Performance Audio Circuitry
• Active Filters
3 Description
The OPA627-DIE DIFET operational amplifier
provides a new level of performance in a precision
FET operational amplifier. The OPA627-DIE has low
noise, low offset voltage, and high speed. It is useful
in a broad range of precision and high-speed analog
circuitry.
The OPA627-DIE is fabricated on a high-speed,
dielectrically-isolated complementary NPN/PNP
process. It operates over a wide range of power
supply voltage. Laser-trimmed DIFET input circuitry
provides high accuracy and low-noise performance
comparable with the best bipolar-input operational
amplifiers.
High frequency complementary transistors allow
increased circuit bandwidth, attaining dynamic
performance not possible with previous precision FET
operational amplifiers. The OPA627-DIE is unity-gain
stable and is stable in gains equal to or greater than
five.
DIFET fabrication achieves extremely-low input bias
currents without compromising input voltage noise
performance. Low input bias current is maintained
over a wide input common-mode voltage range with
unique cascode circuitry.
PRODUCT
OPA627
PACKAGE
DESIGNATOR
TD
Ordering Information⁽¹⁾
PACKAGE
ORDERABLE PART NUMBER PACKAGE QUANTITY
Bare die in waffle pack⁽²⁾
OPA627TDB1
130
OPA627TDB2
10
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
(2) Processing is per the Texas Instruments commercial production baseline and is in compliance with the Texas Instruments Quality
Control System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room
temperature only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not
warranted. Visual Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum.
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.