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OP27GU Datasheet, PDF (1/22 Pages) Texas Instruments – LOW-NOISE HIGH-SPEED PRECISION OPERATIONAL AMPLIFIERS
OP27A, OP27C
LOW-NOISE HIGH-SPEED PRECISION OPERATIONAL AMPLIFIERS
D Replacements for ADI, PMI and LTC OP27
Series
Features of OP27A and OP27C:
D Maximum Equivalent Input Noise Voltage:
3.8 nV/√Hz at 1 kHz
5.5 nV/√Hz at 10 kHz
D Very Low Peak-to-Peak Noise Voltage at
0.1 Hz to 10 Hz . . . 80 nV Typ
D Low Input Offset Voltage
OP27A . . . 25 μV Max
OP27C . . . 100 μV Max
D High Voltage Amplification
OP27A . . . 1 V/ μV Min
OP27C . . . 0.7 V/ μV Min
description
The OP27 operational amplifiers combine out-
standing noise performance with excellent
precision and high-speed specifications. The
wideband noise is only 3 nV/√Hz and with the 1/f
noise corner at 2.7 Hz, low noise is maintained for
all low-frequency applications.
The outstanding characteristics of the OP27 make
these devices excellent choices for low-noise
amplifier applications requiring precision
performance and reliability.
The OP27 series is compensated for unity gain.
The OP27A and OP27C are characterized for
operation over the full military temperature range
of −55°C to 125°C.
SLOS100E − FEBRUARY 1989 − REVISED FEBRUARY 2010
JG PACKAGE
(TOP VIEW)
VIOTRIM 1
IN − 2
IN + 3
VCC − 4
8 VIOTRIM
7 VCC +
6 OUT
5 NC
FK PACKAGE
(TOP VIEW)
NC
1N −
NC
IN +
NC
3 2 1 20 19
4
18
5
17
6
16
7
15
8
14
9 10 11 12 13
NC
VCC +
NC
OUT
NC
symbol
NC − No internal connection
3
IN +
+
2
IN −
−
6 OUT
1
8
VIO TRIM
Pin numbers are for the JG packages.
TA
−55°C to 125°C
VIOmax
AT 25°C
25 μV
100 μV
AVAILABLE OPTIONS
STABLE
GAIN
PACKAGE
CERAMIC DIP
(JG)
CHIP CARRIER
(FK)
1
OP27AJG
OP27AFK
1
OP27CJG
—
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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