MC3487 Datasheet, PDF (1/6 Pages) Texas Instruments – QUADRUPLE DIFFERENTIAL LINE DRIVER

MC3487
QUADRUPLE DIFFERENTIAL LINE DRIVER
D Meets or Exceeds Requirements of ANSI
EIA/TIA-422-B and ITU
Recommendation V.11
D 3-State, TTL-Compatible Outputs
D Fast Transition Times
D High-Impedance Inputs
D Single 5-V Supply
D Power-Up and Power-Down Protection
D Designed to Be Interchangeable With
Motorola MC3487
SLLS098A – MAY 1980 – REVISED MAY 1995
D OR N PACKAGE
(TOP VIEW)
1A 1
1Y 2
1Z 3
1, 2EN 4
2Z 5
2Y 6
2A 7
GND 8
16 V_CC
15 4A
14 4Y
13 4Z
12 3, 4EN
11 3Z
10 3Y
9 3A
description
The MC3487 offers four independent differential line drivers designed to meet the specifications of ANSI
EIA/TIA-422-B and ITU Recommendation V.11. Each driver has a TTL-compatible input buffered to reduce
current and minimize loading.
The driver outputs utilize 3-state circuitry to provide high-impedance states at any pair of differential outputs
when the appropriate output enable is at a low logic level. Internal circuitry is provided to ensure a
high-impedance state at the differential outputs during power-up and power-down transition times provided the
output enable is low. The outputs are capable of source or sink currents of 48 mA.
The MC3487 is designed for optimum performance when used with the MC3486 quadruple line receiver. It is
supplied in a 16-pin dual-in-line package and operates from a single 5-V supply.
The MC3487 is characterized for operation from 0°C to 70°C.
logic symbol^†
4
1, 2EN
EN
1
1A
7
2A
12
3, 4EN
EN
9
3A
15
4A
2
1Y
3
1Z
6
2Y
5
2Z
10
3Y
11
3Z
14
4Y
13
4Z
† _{This symbol is in accordance with ANSI/IEEE Std 91-1984}
and IEC Publication 617-12.
logic diagram (positive logic)
4
1, 2EN
1
1A
7
2A
2
1Y
3
1Z
6
2Y
5
2Z
12
3, 4EN
9
3A
15
4A
10
3Y
11
3Z
14
4Y
13
4Z
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Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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Copyright © 1995, Texas Instruments Incorporated
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