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LP3997_15 Datasheet, PDF (1/18 Pages) Texas Instruments – Micropower 250-mA CMOS LDO Regulator With Error Flag and Power-On-Reset
LP3997
www.ti.com
SNVS272B – MAY 2004 – REVISED MAY 2013
Micropower 250-mA CMOS LDO Regulator With Error Flag and Power-On-Reset
Check for Samples: LP3997
FEATURES
1
•2 Low 140-mV Dropout at 250-mA Load
• Stable With Ceramic Capacitor.
• Low Noise With Bypass Capacitor
• Less Than 80 µA Typical IQ at 250 mA
• Virtually Zero IQ (Disabled)
• Thermal and Short Circuit Protection
• 3.3-V Output (1)
• 8-Lead VSSOP Package (2)
APPLICATIONS
• Portable Consumer Electronics
• Cellular Handsets
• Laptop and Palm Computers
• PDAs
• Digital Cameras
(1) For other voltage options, contact your TI sales office
(2) For other package options, contact your TI sales office.
DESCRIPTION
The LP3997 regulator is designed to meet the
requirements of portable, battery-powered systems,
providing accurate output voltage, low noise, and low
quiescent current. The LP3997 provides 3.3V output
at up to 250mA load current. The chip architecture is
capable of providing output voltages as low as 0.8V.
When switched in shutdown mode, the power
consumption is virtually zero.
The LP3997 is designed to be stable with space
saving ceramic output capacitor as small as 1µF.
The LP3997 also includes an out-of-regulation error
flag. When the output is more than 5% below its
nominal voltage, the error flag sets to low. If a
capacitor is connected to device’s delay pin, a
delayed power-on reset signal will be generated.
Typical Application Circuit
VIN
Enable
2.2 PF
4
VIN
5
VOUT
8
SD
6
SENSE
LP3997
470k
2
DELAY
7
ERROR
1
GND CBYP
0.1 PF
3
0.1 PF
VOUT
Error/POR
2.2 PF
1
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Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2004–2013, Texas Instruments Incorporated