LP3876-ADJ_15 Datasheet, PDF (1/19 Pages) Texas Instruments – LP3876-ADJ 3A Fast Ultra Low Dropout Linear Regulator

LP3876-ADJ
www.ti.com
SNVS245C – SEPTEMBER 2003 – REVISED APRIL 2013
LP3876-ADJ 3A Fast Ultra Low Dropout Linear Regulator
Check for Samples: LP3876-ADJ
FEATURES
1
•2 Ultra Low Dropout Voltage
• Low Ground Pin Current
• Load Regulation of 0.08%
• 1µA Quiescent Current in Shutdown Mode
• Specified Output Current of 3A DC
• Available in DDPAK/TO-263 and TO-220
Packages
• Minimum output Capacitor Requirements
• Overtemperature/Overcurrent Protection
• −40°C to +125°C Junction Temperature Range
APPLICATIONS
• Microprocessor Power Supplies
• GTL, GTL+, BTL, and SSTL bus terminators
• Power Supplies for DSPs
• SCSI Terminator
• Post Regulators
• High Efficiency Linear Regulators
• Battery Chargers
• Other Battery Powered Applications
DESCRIPTION
The LP3876-ADJ fast ultra low-dropout linear
regulators operate from a +2.5V to +7.0V input
supply. These ultra low dropout linear regulators
respond very quickly to step changes in load, which
makes them suitable for low voltage microprocessor
applications. The LP3876-ADJ is developed on a
CMOS process which allows low quiescent current
operation independent of output load current. This
CMOS process also allows the LP3876-ADJ to
operate under extremely low dropout conditions.
Dropout Voltage: Ultra low dropout voltage; typically
80mV at 300mA load current and 800mV at 3A load
current.
Ground Pin Current: Typically 6mA at 3A load
current.
Shutdown Mode: Typically 1µA quiescent current
when the shutdown pin is pulled low.
Adjustable Output Voltage: The output voltage may
be programmed via two external resistors.
TYPICAL APPLICATION CIRCUIT
INPUT
*
SD
CIN
10 PF
VIN
VOUT
LP3876-ADJ
R1*
SD
ADJ
GND
R2*
OUTPUT
3A
CFF*
COUT
10 PF
Tantalum
*See Application Hints
V_OUT = 1.216 x (1+
R1 ₎
R2
1
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2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2003–2013, Texas Instruments Incorporated