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LP2981IM5-3.3 Datasheet, PDF (1/24 Pages) Texas Instruments – LP2981-N Micropower 100 mA Ultra Low-Dropout Regulator in SOT-23 Package
LP2981-N
www.ti.com
SNOS773K – MARCH 2000 – REVISED APRIL 2013
LP2981-N Micropower 100 mA Ultra Low-Dropout Regulator in SOT-23 Package
Check for Samples: LP2981-N
FEATURES
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•2 Ultra Low Dropout Voltage
• Output Voltage Accuracy 0.75% (A Grade)
• Specified 100 mA Output Current
• < 1 μA Quiescent Current when Shutdown
• Low Ground Pin Current at All Load Currents
• High Peak Current Capability (300 mA Typical)
• Wide Supply Voltage Range (16V Max)
• Fast Dynamic Response to Line and Load
• Low ZOUT Over Wide Frequency Range
• Overtemperature/Overcurrent Protection
• −40°C to +125°C Junction Temperature Range
APPLICATIONS
• Cellular Phone
• Palmtop/Laptop Computer
• Personal Digital Assistant (PDA)
• Camcorder, Personal Stereo, Camera
DESCRIPTION
The LP2981-N is a 100 mA, fixed-output voltage
regulator designed specifically to meet the
requirements of battery-powered applications.
Using an optimized VIP (Vertically Integrated PNP)
process, the LP2981-N delivers unequaled
performance in all specifications critical to battery-
powered designs:
Dropout Voltage. Typically 200 mV @ 100 mA load,
and 7 mV @ 1 mA load.
Ground Pin Current. Typically 600 μA @ 100 mA
load, and 80 μA @ 1 mA load.
Sleep Mode. Less than 1 μA quiescent current when
ON/OFF pin is pulled low.
Precision Output. 0.75% tolerance output voltages
available (A grade).
Nine voltage options, from 2.5V to 5.0V, are available
as standard products.
Block Diagram
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Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2000–2013, Texas Instruments Incorporated