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LOG112AIDRE4 Datasheet, PDF (1/20 Pages) Texas Instruments – Precision LOGARITHMIC AND LOG RATIO AMPLIFIERS
LOG112
LOG2112
LOG112
LOG2112
SBOS246D – JUNE 2002 – REVISED APRIL 2005
Precision
LOGARITHMIC AND LOG RATIO AMPLIFIERS
FEATURES
DESCRIPTION
q EASY-TO-USE COMPLETE FUNCTION
q OUTPUT SCALING AMPLIFIER
q ON-CHIP 2.5V VOLTAGE REFERENCE
q HIGH ACCURACY: 0.2% FSO Over 5 Decades
q WIDE INPUT DYNAMIC RANGE:
7.5 Decades, 100pA to 3.5mA
q LOW QUIESCENT CURRENT: 1.75mA
q WIDE SUPPLY RANGE: ±4.5V to ±18V
q PACKAGES: SO-14 (narrow) and SO-16
APPLICATIONS
The LOG112 and LOG2112 are versatile integrated circuits
that compute the logarithm or log ratio of an input current
relative to a reference current. VLOGOUT of the LOG112 and
LOG2112 are trimmed to 0.5V per decade of input current,
ensuring high precision over a wide dynamic range of input
signals.
The LOG112 and LOG2112 features a 2.5V voltage refer-
ence that may be used to generate a precision current
reference using an external resistor.
Low DC offset voltage and temperature drift allow accurate
measurement of low-level signals over the specified tem-
perature range of –5°C to +75°C.
q LOG, LOG RATIO:
Communication, Analytical, Medical, Industrial,
Test, General Instrumentation
q PHOTODIODE SIGNAL COMPRESSION AMP
q ANALOG SIGNAL COMPRESSION IN FRONT
OF ANALOG-TO-DIGITAL (A/D) CONVERTER
q ABSORBANCE MEASUREMENT
q OPTICAL DENSITY MEASUREMENT
VLOGOUT = (0.5V)LOG (I1/I2)
VO3 = K (0.5V)LOG (I1/I2), K = 1 + R2/R1 CC
V+
I1
Q1
Q2
R1
R2
VLOGOUT
+IN3
–IN3
LOG112
I2
A1
RREF
A2
A3
VO3
VREF
VREF
GND
VREF – GND VCM
V–
NOTE: Internal resistors are used to compensate gain change over temperature.
The VCM pin is internally connected to GND in the LOG2112.
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Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
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PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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