LMT85 Datasheet, PDF (1/16 Pages) Texas Instruments – LMT85/LMT85-Q1 SC70, Analog Temperature Sensors with Class-AB Output

LMT85, LMT85-Q1
www.ti.com
SNIS168A – MARCH 2013 – REVISED JUNE 2013
LMT85/LMT85-Q1 SC70, Analog Temperature Sensors with Class-AB Output
Check for Samples: LMT85, LMT85-Q1
FEATURES
1
•2 LMT85-Q1 is AEC-Q100 Grade 0 qualified and
is Manufactured on an Automotive Grade Flow
• Push-Pull Output with 50 µA Source Current
Capability
• Very Accurate Over Wide Temperature Range
of −50°C to 150°C
• Low Quiescent Current
• Output is Short-Circuit Protected
• Extremely Small SC70 Package
• Cost-effective Alternative to Thermistors
APPLICATIONS
• Automotive
• Industrial
• White Goods
• Battery Management
• Disk Drives
• Appliances
• Games
• Wireless Transceivers
• Cell phones
DESCRIPTION
The LMT85/LMT85-Q1 are precision analog output
CMOS integrated-circuit temperature sensors that
operates at a supply voltage as low as 1.8 Volts. A
class-AB output structure gives the LMT85/LMT85-
Q1 strong output source and sink current capability
for driving heavy loads. This means it is well suited to
source the input of a sample-and-hold analog-to-
digital converter with its transient load requirements.
While operating over the wide temperature range of
−50°C to 150°C, the device delivers an output voltage
that is inversely proportional to measured
temperature. The LMT85/LMT85-Q1 low supply
current makes it ideal for battery-powered systems as
well as general temperature sensing applications.
The LMT85/LMT85-Q1 can operate with a 1.8V
supply while measuring temperature over the full
−50°C to150°C operating range.
The LMT85/LMT85-Q1 are cost-competitive
alternatives to thermistors.
CONNECTION DIAGRAM
1
V_DD
2
GND
3
OUT
LMT85
5
GND
4 _VDD
TYPICAL TRANSFER CHARACTERISTIC
Output Voltage vs Temperature
Figure 1. SOT Top View
See Package Number DCK0005A
1
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2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2013, Texas Instruments Incorporated