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LM4881_15 Datasheet, PDF (1/15 Pages) Texas Instruments – Dual 200 mW Headphone Amplifier with Shutdown Mode
LM4881
www.ti.com
SNAS001D – SEPTEMBER 1997 – REVISED MAY 2013
LM4881
Dual 200 mW Headphone Amplifier with
Shutdown Mode
Check for Samples: LM4881
FEATURES
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•23 VSSOP Surface Mount Packaging
• Unity-gain Stable
• External Gain Configuration Capability
• Thermal Shutdown Protection Circuitry
• No Bootstrap Capacitors, or Snubber Circuits
are Necessary
APPLICATIONS
• Headphone Amplifier
• Personal Computers
• Microphone Preamplifier
KEY SPECIFICATIONS
• THD+N at 1kHz at 125mW Continuous Average
Output Power into 8Ω 0.1% (max)
• THD+N at 1kHz at 75mW Continuous
0.02% (typ)
• Output Power at 10% THD+N at 1kHz into 8Ω
300 mW (typ)
• Shutdown Current 0.7µA (typ)
• Supply Voltage Range 2.7V to 5.5 V
DESCRIPTION
The LM4881 is a dual audio power amplifier capable
of delivering 200mW of continuous average power
into an 8Ω load with 0.1% THD+N from a 5V power
supply.
Boomer™ audio power amplifiers were designed
specifically to provide high quality output power with a
minimal amount of external components using
surface mount packaging. Since the LM4881 does
not require bootstrap capacitors or snubber networks,
it is optimally suited for low-power portable systems.
The LM4881 features an externally controlled, low
power consumption shutdown mode which is virtually
clickless and popless, as well as an internal thermal
shutdown protection mechanism.
The unity-gain stable LM4881 can be configured by
external gain-setting resistors.
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Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Boomer is a trademark of Texas Instruments.
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All other trademarks are the property of their respective owners.
3
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 1997–2013, Texas Instruments Incorporated