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LM3700XCBP-290 Datasheet, PDF (1/12 Pages) Texas Instruments – LM3700/LM3701 Microprocessor Supervisory Circuit with Low Line Output
OBSOLETE
LM3700, LM3701
www.ti.com
SNVS146E – NOVEMBER 2000 – REVISED APRIL 2013
LM3700/LM3701 Microprocessor Supervisory Circuit with Low Line Output
Check for Samples: LM3700, LM3701
FEATURES
1
•2 Standard Reset Threshold Voltage: 3.08V
• Custom Reset Threshold Voltages: For Other
Voltages between 2.2V and 5.0V in 10mV
Increments, Contact Texas Instruments.
• No External Components Required
• RESET (LM3700) or RESET (LM3701) Outputs
• Precision Supply Voltage Monitor
• Factory Programmable Reset Timeout Delay
• Available in micro SMD Package for Minimum
Footprint
• ±0.5% Reset Threshold Accuracy at Room
Temperature
• ±2% Reset Threshold Accuracy Over
Temperature Extremes
• Reset Assertion Down to 1V VCC (RESET
Option Only)
• 28 µA VCC Supply Current
DESCRIPTION
The LM3700/LM3701 series of microprocessor
supervisory circuits provide the maximum flexibility for
monitoring power supplies and battery controlled
functions in systems without backup batteries. The
LM3700/LM3701 series are available in a 9-bump
micro SMD package.
Built-in features include the following:
Reset: Reset is asserted during power-up, power-
down, and brownout conditions. RESET is specified
down to VCC of 1.0V.
Low Line Output: This early power failure warning
indicator goes low when the supply voltage drops to a
value which is 2% higher than the reset threshold
voltage.
APPLICATIONS
• Embedded Controllers and Processors
• Intelligent Instruments
• Automotive Systems
• Critical µP Power Monitoring
Typical Application
VIN
VCC
Reset
VCC
Reset
PP
LLO
GND
INT
GND
1
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Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2000–2013, Texas Instruments Incorporated