LM359MX Datasheet, PDF (1/34 Pages) Texas Instruments – LM359 Dual, High Speed, Programmable, Current Mode (Norton) Amplifiers

LM359
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SNOSBT4C – MAY 1999 – REVISED MARCH 2013
LM359 Dual, High Speed, Programmable, Current Mode (Norton) Amplifiers
Check for Samples: LM359
FEATURES
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•2 User Programmable Gain Bandwidth Product,
Slew Rate, Input Bias Current, Output Stage
Biasing Current and Total Device Power
Dissipation
• High Gain Bandwidth Product (I_SET = 0.5 mA)
– 400 MHz for A_V = 10 to 100
– 30 MHz for A_V = 1
• High Slew Rate (I_SET = 0.5 mA)
– 60 V/μs for A_V = 10 to 100
– 30 V/μs for A_V = 1
• Current Differencing Inputs Allow High
Common-Mode Input Voltages
• Operates from a Single 5V to 22V Supply
• Large Inverting Amplifier Output Swing, 2 mV
to V_CC − 2V
• Low Spot Noise, 6 nV /√Hz, for f > 1 kHz
APPLICATIONS
• General Purpose Video Amplifiers
• High Frequency, High Q Active Filters
• Photo-Diode Amplifiers
• Wide Frequency Range Waveform Generation
Circuits
• All LM3900 AC Applications Work to Much
Higher Frequencies
DESCRIPTION
The LM359 consists of two current differencing
(Norton) input amplifiers. Design emphasis has been
placed on obtaining high frequency performance and
providing user programmable amplifier operating
characteristics. Each amplifier is broadbanded to
provide a high gain bandwidth product, fast slew rate
and stable operation for an inverting closed loop gain
of 10 or greater. Pins for additional external
frequency compensation are provided. The amplifiers
are designed to operate from a single supply and can
accommodate input common-mode voltages greater
than the supply.
Typical Application
Connection Diagram
• A_V = 20 dB
• −3 dB bandwidth = 2.5 Hz to 25 MHz
• Differential phase error < 1° at 3.58
MHz
• Differential gain error < 0.5% at 3.58
MHz
Figure 1. PDIP/SOIC Package
Top View
See Package Number D0014A or NFF0014A
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2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
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