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LM27313XMF Datasheet, PDF (1/20 Pages) Texas Instruments – LM27313/LM27313-Q1
LM27313
www.ti.com
SNVS487D – DECEMBER 2006 – REVISED APRIL 2013
LM27313/LM27313-Q1
Check for Samples: LM27313
FEATURES
1
•2 LM27313-Q1 is an Automotive Grade Product
that is AEC-Q100 Grade 1 Qualified (-40°C to
+125°C Operating Junction Temperature)
• 30V DMOS FET Switch
• 1.6 MHz Switching Frequency
• Low RDS(ON) DMOS FET
• Switch Current up to 800 mA
• Wide Input Voltage Range (2.7V–14V)
• Low Shutdown Current (<1 µA)
• 5-Lead SOT-23 Package
• Uses Tiny Capacitors and Inductors
• Cycle-by-Cycle Current Limiting
• Internally Compensated
DESCRIPTION
The LM27313 switching regulator is a current-mode
boost converter with a fixed operating frequency of
1.6 MHz.
The use of the SOT-23 package, made possible by
the minimal losses of the 800 mA switch, and small
inductors and capacitors result in extremely high
power density. The 30V internal switch makes these
solutions perfect for boosting to voltages of 5V to
28V.
This part has a logic-level shutdown pin that can be
used to reduce quiescent current and extend battery
life.
Protection is provided through cycle-by-cycle current
limiting and thermal shutdown. Internal compensation
simplifies design and reduces component count.
APPLICATIONS
• White LED Current Source
• PDA’s and Palm-Top Computers
• Digital Cameras
• Portable Phones, Games and Media Players
• GPS Devices
Typical Application Circuits
5 VIN
SHDN
GND
R3
51k
C1
2.2 PF
L1/10 PH
VIN U1 SW
LM27313
SHDN
FB
GND
R2
13.3k
D1
MBR0520
R1/117k
CF
220 pF
12V
OUT
260 mA
(TYP)
C2
4.7 PF
5 VIN
SHDN
GND
R3
51k
C1
2.2 PF
L1/10 PH
VIN U1 SW
LM27313
SHDN
FB
GND
R2
13.3k
D1
MBR0530
R1/205k
CF
120 pF
20V
OUT
130 mA
(TYP)
C2
4.7 PF
1
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Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2006–2013, Texas Instruments Incorporated