LF412-N Datasheet, PDF (1/17 Pages) Texas Instruments – LF412 Low Offset, Low Drift Dual JFET Input Operational Amplifier

LF412-N
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SNOSBH7E – APRIL 1999 – REVISED MARCH 2013
LF412 Low Offset, Low Drift Dual JFET Input Operational Amplifier
Check for Samples: LF412-N
FEATURES
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•23 Internally Trimmed Offset Voltage: 1 mV (max)
• Input Offset Voltage Drift: 10 µV/°C (max)
• Low Input Bias Current: 50 pA
• Low Input Noise Current: 0.01 pA / √Hz
• Wide Gain Bandwidth: 3 MHz (min)
• High Slew Rate: 10V/µs (min)
• Low Supply Current: 1.8 mA/Amplifier
• High Input Impedance: 10¹²Î©
• Low Total Harmonic Distortion: ≤0.02%
• Low 1/f Noise Corner: 50 Hz
• Fast Settling Time to 0.01%: 2 µs
DESCRIPTION
These devices are low cost, high speed, JFET input
operational amplifiers with very low input offset
voltage and guaranteed input offset voltage drift.
They require low supply current yet maintain a large
gain bandwidth product and fast slew rate. In
addition, well matched high voltage JFET input
devices provide very low input bias and offset
currents. The LF412 dual is pin compatible with the
LM1558, allowing designers to immediately upgrade
the overall performance of existing designs.
These amplifiers may be used in applications such as
high speed integrators, fast D/A converters, sample
and hold circuits and many other circuits requiring low
input offset voltage and drift, low input bias current,
high input impedance, high slew rate and wide
bandwidth.
Typical Connection
Connection Diagram
Figure 1.
Figure 2. TO Package – Top View
See Package Number NEV0008A
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Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
BI-FET II is a trademark of Texas Instruments.
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All other trademarks are the property of their respective owners.
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PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 1999–2013, Texas Instruments Incorporated