English
Language : 

LF411-N Datasheet, PDF (1/16 Pages) Texas Instruments – LF411 Low Offset, Low Drift JFET Input Operational Amplifier
LF411-N
www.ti.com
SNOSBH6D – APRIL 1998 – REVISED MARCH 2013
LF411 Low Offset, Low Drift JFET Input Operational Amplifier
Check for Samples: LF411-N
FEATURES
1
•23 Internally trimmed offset voltage: 0.5 mV(max)
• Input offset voltage drift: 10 μV/°C(max)
• Low input bias current: 50 pA
• Low input noise current: 0.01 pA/√Hz
• Wide gain bandwidth: 3 MHz(min)
• High slew rate: 10V/μs(min)
• Low supply current: 1.8 mA
• High input impedance: 1012Ω
• Low total harmonic distortion: ≤0.02%
• Low 1/f noise corner: 50 Hz
• Fast settling time to 0.01%: 2 μs
DESCRIPTION
These devices are low cost, high speed, JFET input
operational amplifiers with very low input offset
voltage and specified input offset voltage drift. They
require low supply current yet maintain a large gain
bandwidth product and fast slew rate. In addition, well
matched high voltage JFET input devices provide
very low input bias and offset currents. The LF411 is
pin compatible with the standard LM741 allowing
designers to immediately upgrade the overall
performance of existing designs.
These amplifiers may be used in applications such as
high speed integrators, fast D/A converters, sample
and hold circuits and many other circuits requiring low
input offset voltage and drift, low input bias current,
high input impedance, high slew rate and wide
bandwidth.
Typical Connection
Connection Diagram
Figure 1.
Note: Pin 4 connected to case.
Figure 2. TO – Top View
See Package Number NEV0008A
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
BI-FET II is a trademark of dcl_owner.
2
All other trademarks are the property of their respective owners.
3
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 1998–2013, Texas Instruments Incorporated