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INA282_12 Datasheet, PDF (1/33 Pages) Texas Instruments – High-Accuracy, Wide Common-Mode Range, Bi-Directional CURRENT SHUNT MONITOR
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INA28x
INA282, INA283
INA284, INA285
INA286
SBOS485B – NOVEMBER 2009 – REVISED SEPTEMBER 2012
High-Accuracy, Wide Common-Mode Range, Bi-Directional
CURRENT SHUNT MONITOR
Zerø-Drift Series
Check for Samples: INA282, INA283, INA284, INA285, INA286
FEATURES
1
•2 WIDE COMMON-MODE RANGE: –14V to 80V
• OFFSET VOLTAGE: ±20μV
• CMRR: 140dB
• ACCURACY:
– ±1.4% Gain Error (Max)
– 0.3μV/°C Offset Drift
– 0.005%/°C Gain Drift (Max)
• AVAILABLE GAINS:
– 50V/V: INA282
– 100V/V: INA286
– 200V/V: INA283
– 500V/V: INA284
– 1000V/V: INA285
• QUIESCENT CURRENT: 900μA (Max)
APPLICATIONS
• TELECOM EQUIPMENT
• AUTOMOTIVE
• POWER MANAGEMENT
• SOLAR INVERTERS
DESCRIPTION
The INA282 family, which includes the INA282,
INA283, INA284, INA285, and INA286 devices, are
voltage output current shunt monitors that can sense
drops across shunts at common-mode voltages from
–14V to +80V, independent of the supply voltage.
The low offset of the Zerø-Drift architecture enables
current sensing with maximum drops across the
shunt as low as 10mV full-scale.
These current shunt monitors operate from a single
+2.7V to +18V supply, drawing a maximum of 900μA
of supply current. They are specified over the
extended operating temperature range of –40°C to
+125°C, and offered in an SOIC-8 package.
Supply
-14V to +80V
Load
+2.7V to +18V
+IN
-IN
V+
1
Æ2
Æ2
Æ1
Æ2
Æ2
1
Æ1
GAIN
50V/V
100V/V
200V/V
500V/V
1000V/V
PRODUCT
INA282
INA286
INA283
INA284
INA285
GND
ZerÆ-
Drift
OUT
33.3kW REF2
33.3kW REF1
Output
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2009–2012, Texas Instruments Incorporated