INA282-Q1 Datasheet, PDF (1/30 Pages) Texas Instruments – High-Accuracy, Wide Common-Mode Range, Bi-Directional

INA28x
INA282-Q1
www.ti.com
SBOS554 – MARCH 2012
High-Accuracy, Wide Common-Mode Range, Bi-Directional
CURRENT SHUNT MONITOR
Zerø-Drift Series
Check for Samples: INA282-Q1
FEATURES
1
•2 Qualified for Automotive Applications
• AEC-Q100 Qualified With the Following
Results
– Device Temperature Grade 1: –40°C to
+125°C Ambient Operating Temperature
Range
– Device HBM ESD Classification Level H2
– Device CDM ESD Classification Level C3B
• Wide Common-Mode Range: –14V to 80V
• Offset Voltage: ±20 μV
• CMRR: 140 dB
• Accuracy:
– ±1.4% Gain Error (Max)
– 0.3μV/°C Offset Drift
– 0.005%/°C Gain Drift (Max)
• Available Gains:
– 50V/V: INA282
– 100V/V: INA286
– 200V/V: INA283
– 500V/V: INA284
– 1000V/V: INA285
• Quiescent Current: 900 μA (Max)
APPLICATIONS
• Telecom Equipment
• Automotive
• Power Management
• Solar Inverters
DESCRIPTION
The INA282-Q1 is a voltage output current shunt
monitor that can sense drops across shunts at
common-mode voltages from –14V to +80V,
independent of the supply voltage. The low offset of
the Zerø-Drift architecture enables current sensing
with maximum drops across the shunt as low as
10mV full-scale.
This current shunt monitor operates from a single
+2.7V to +18V supply, drawing a maximum of 900μA
of supply current. It is specified over the extended
operating temperature range of –40°C to +125°C, and
offered in an SOIC-8 package.
Supply
-14V to +80V
Load
+2.7V to +18V
+IN
-IN
V+
1
Æ2
Æ2
Æ1
Æ2
Æ2
1
Æ1
GAIN
50V/V
100V/V
200V/V
500V/V
1000V/V
PRODUCT
INA282
INA286
INA283
INA284
INA285
GND
ZerÆ-
Drift
OUT
33.3kW _REF2
33.3kW _REF1
Output
1
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Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2012, Texas Instruments Incorporated