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INA139-Q1_15 Datasheet, PDF (1/16 Pages) Texas Instruments – HIGH-SIDE MEASUREMENT CURRENT SHUNT MONITOR
INA139-Q1
INA169-Q1
www.ti.com
SGLS185E – SEPTEMBER 2003 – REVISED MAY 2011
HIGH-SIDE MEASUREMENT CURRENT SHUNT MONITOR
Check for Samples: INA139-Q1, INA169-Q1
FEATURES
1
• Qualified for Automotive Applications
• ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V Using Machine Model
(C = 200 pF, R = 0)
• Complete Unipolar High-Side Current Measurement Circuit
• Wide Supply and Common-Mode Ranges
– INA139-Q1: 2.7 V to 40 V
– INA169-Q1: 2.7 V to 60 V
• Independent Supply and Input Common-Mode Voltages
• Single Resistor Gain Set
• Low Quiescent Current (60 μA Typ)
• Wide Temperature Range: –40°C to +125°C
• TSSOP-8 Package
APPLICATIONS
• Current Shunt Measurement:
– Automotive, Telephone, Computers
• Portable And Battery-Backup Systems
• Battery Chargers
• Power Management
• Cell Phones
• Precision Current Source
DESCRIPTION
The INA139 and INA169 are high-side, unipolar, current shunt monitors. Wide input common-mode voltage
range, high-speed, low quiescent current, and tiny TSSOP-8 packaging enable use in a variety of applications.
The device converts a differential input voltage to a current output. This current is converted back to a voltage
with an external load resistor that sets any gain from 1 to over 100. Although designed for current shunt
measurement, the circuit invites creative applications in measurement and level shifting.
Both the INA139 and INA169 are available in TSSOP-8 and are specified for the –40°C to 125°C temperature
range.
PW PACKAGE
(TOP VIEW)
VIN–
1
VIN+
2
NC
3
GND
4
8
V+
7
NC
6
OUT
5
NC
NC − No internal connection
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2003–2011, Texas Instruments Incorporated