INA138-Q1_15 Datasheet, PDF (1/22 Pages) Texas Instruments – HIGH-SIDE MEASUREMENT CURRENT SHUNT MONITOR

INA138-Q1, INA168-Q1
www.ti.com
SGLS174G – SEPTEMBER 2003 – REVISED JANUARY 2013
HIGH-SIDE MEASUREMENT CURRENT SHUNT MONITOR
Check for Samples: INA138-Q1, INA168-Q1
FEATURES
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• Qualified For Automotive Applications
• ESD Protection Exceeds 2000 V Per MIL-STD-
883, Method 3015; Exceeds 200 V Using
Machine Model (C = 200 pF, R = 0)
• Complete Unipolar High-Side Current-
Measurement Circuit
• Wide Supply And Common-Mode Range
– INA138-Q1: 2.7 V to 36 V
– INA168-Q1: 2.7 V to 60 V
• Independent Supply and Input Common-Mode
Voltages
• Single Resistor Gain Set
• Low Quiescent Current (25 µA Typical)
• Wide Temperature Range: –40°C to 125°C
• TSSOP−8 and SOT23−5 Packages
APPLICATIONS
• Current Shunt Measurement
• Portable and Battery-Backup Systems
• Battery Chargers
• Power Management
• Precision Current Source
DESCRIPTION
The INA138-Q1 and INA168-Q1 are high-side,
unipolar, current shunt monitors. Wide input common-
mode voltage range, low quiescent current, and tiny
TSSOP and SOT23 packaging enable uses in a
variety of applications.
Input common-mode and power-supply voltages are
independent and can range from 2.7 V to 36 V for the
INA138-Q1 and 2.7 V to 60 V for the INA168-Q1.
Quiescent current is only 25 μA, which permits
connecting the power supply to either side of the
current-measurement shunt with minimal error.
The device converts a differential input voltage to a
current output. This current is converted back to a
voltage with an external load resistor that sets any
gain from 1 to over 100. Although designed for
current shunt measurement, the circuit invites
creative applications in measurement and level
shifting.
Both the INA138-Q1 and INA168-Q1 are available in
TSSOP−8 and SOT23−5 and are specified for the
–40°C to 125°C temperature range.
W
W
NC − No internal connection
W
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PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
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necessarily include testing of all parameters.
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