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DS8921AM-NOPB Datasheet, PDF (1/15 Pages) Texas Instruments – DS8921/DS8921A/DS8921AT Differential Line Driver and Receiver Pair
DS8921, DS8921A, DS8921AT
www.ti.com
SNLS374C – MAY 1998 – REVISED APRIL 2013
DS8921/DS8921A/DS8921AT Differential Line Driver and Receiver Pair
Check for Samples: DS8921, DS8921A, DS8921AT
FEATURES
1
•2 12 ns Typical Propagation Delay
• Output Skew - 0.5 ns Typical
• Meet the Requirements of EIA Standard RS-
422
• Complementary Driver Outputs
• High Differential or Common-Mode Input
Voltage Ranges of ±7V
• ±0.2V Receiver Sensitivity over the Input
Voltage Range
• Receiver Input Hysteresis-70 mV Typical
• DS8921AT Industrial Temperature Operation:
(−40°C to +85°C)
DESCRIPTION
The DS8921, DS8921A are Differential Line Driver
and Receiver pairs designed specifically for
applications meeting the ST506, ST412 and ESDI
Disk Drive Standards. In addition, these devices meet
the requirements of the EIA Standard RS-422.
The DS8921, DS8921A receivers offer an input
sensitivity of 200 mV over a ±7V common mode
operating range. Hysteresis is incorporated (typically
70 mV) to improve noise margin for slowly changing
input waveforms.
The DS8921, DS8921A drivers are designed to
provide unipolar differential drive to twisted pair or
parallel wire transmission lines. Complementary
outputs are logically ANDed and provide an output
skew of 0.5 ns (typ.) with propagation delays of
12 ns.
The DS8921, DS8921A are designed to be
compatible with TTL and CMOS.
Connection Diagram
VID ≥ VTH (MAX)
VID ≤ VTH (MIN)
Open
DS8921/DS8921A/DS8921AT
See Package Number D (R-PDSO-G8) or P (R-PDIP-T8)
Receiver
Input
Truth Table
VOUT
1
0
1
Input
1
0
Driver
VOUT
1
0
VOUT
0
1
1
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Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 1998–2013, Texas Instruments Incorporated