DAC161P997-DIE_15 Datasheet, PDF (1/5 Pages) Texas Instruments – Single-Wire 16-Bit DAC

DAC161P997-DIE
www.ti.com
Single-Wire 16-Bit DAC
Check for Samples: DAC161P997-DIE
FEATURES
1
•2 16-Bit Linearity
• Single-Wire Interface (SWIF) With Handshake
• Digital Data Transmission (No Loss of Fidelity)
• Pin Programmable Power-Up Condition
• Self Adjusting to Input Data Rate
• Loop Error Detection and Reporting
• Programmable Output Current Error Level
• No External Precision Components
• Simple Interface to HART Modulator
APPLICATIONS
• Current Loop Transmitter
• Industrial Process Control
• Actuator Control
• Factory Automation
• Building Automation
• Precision Instruments
• Data Acquisition Systems
• Test Systems
SLAS940 – MARCH 2013
DESCRIPTION
The DAC161P997-DIE is a 16- bit ∑Δ digital-to-analog converter (DAC) for transmitting an analog output current.
The data link to the DAC161P997-DIE is a single wire interface (SWIF) which allows sensor data to be
transferred in digital format over an isolation boundary using a single isolation component. The
DAC161P997-DIE’s digital input is compatible with standard isolation transformers and optocouplers. Error
detection and handshaking features within the SWIF protocol ensure error free communication across the
isolation boundary. For applications where isolation is not required, the DAC161P997-DIE interfaces directly to a
microcontroller.
The loop drive of the DAC161P997-DIE interfaces to a highway addressable remote transducer (HART)
modulator, allowing injection of FSK modulated digital data into the current loop. This combination of
specifications and features makes the DAC161P997-DIE ideal for 2- and 4-wire industrial transmitters.
PRODUCT
DAC161P997
PACKAGE
DESIGNATOR
TD
ORDERING INFORMATION⁽¹⁾
PACKAGE
ORDERABLE PART NUMBER PACKAGE QUANTITY
Bare die in waffle pack⁽²⁾
DAC161P997TDA1
324
DAC161P997TDA2
10
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
(2) Processing is per the Texas Instruments commercial production baseline and is in compliance with the Texas Instruments Quality
Control System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room
temperature only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not
warranted. Visual Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2013, Texas Instruments Incorporated