CSD96371Q5M Datasheet, PDF (1/18 Pages) Texas Instruments – Synchronous Buck NexFET Power Stage

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Synchronous Buck NexFET™ Power Stage
CSD96371Q5M
SLPS299 – DECEMBER 2012
FEATURES
1
•2 92% System Efficiency at 30A
• High Frequency Operation (Up To 2MHz)
• High Density – SON 5-mm × 6-mm Footprint
• Low Power Loss 3.4W at 30A
• Ultra Low Inductance Package
• System Optimized PCB Footprint
• 3.3V and 5V PWM Signal Compatible
• 3-State PWM Input
• Integrated Bootstrap Diode
• Pre-Bias Start-Up Protection
• Shoot Through Protection
• RoHS Compliant – Lead Free Terminal Plating
Halogen Free
APPLICATIONS
• Synchronous Buck Converters
• Multiphase Synchronous Buck Converters
• POL DC-DC Converters
• Memory and Graphic Cards
• Desktop and Server VR11.x and VR12 V-Core
Synchronous Buck Converters
ORDERING INFORMATION
Device
Package
Media Qty
CSD96371Q5M
SON 5-mm × 6-mm
Plastic Package
13-Inch
Reel
2500
Ship
Tape and
Reel
DESCRIPTION
The CSD96371Q5M NexFET™ Power Stage has an optimized design for use in a high power high density
Synchronous Buck converter. This product integrates the gate driver IC and Power MOSFETs to complete the
power stage switching function. This combination produces high current, high efficiency, and high speed
switching capability in a small 5-mm × 6-mm outline package. In addition, the PCB footprint has been optimized
to help reduce design time and simplify the completion of the overall system design.
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100
5
90
4
80
3
70
2
60
50
0
1
Efficiency
Power Loss
0
5
10
15
20
25
30
Output Current (A)
G001
Figure 1. Application Diagram
Figure 2. Efficiency and Power Loss
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
NexFET is a trademark of Texas Instruments.
2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2012, Texas Instruments Incorporated