CSD87588N Datasheet, PDF (1/20 Pages) Texas Instruments – Synchronous Buck NexFET Power Block II

CSD87588N
www.ti.com
SLPS384A – MARCH 2013 – REVISED MAY 2013
Synchronous Buck NexFET™ Power Block II
FEATURES
1
•2 Half-Bridge Power Block
• 90% system Efficiency at 20A
• Up To 25A Operation
• High Density – 5-mm x 2.5-mm LGA Footprint
• Double Side Cooling Capability
• Ultra Low Profile – 0.48-mm MAX
• Optimized for 5V Gate Drive
• Low Switching Losses
• Low Inductance Package
• RoHS Compliant
• Halogen Free
• Pb-Free Terminal Plating
APPLICATIONS
• Synchronous Buck Converters
– High Current, Low Duty Cycle Applications
• Multiphase Synchronous Buck Converters
• POL DC-DC Converters
DESCRIPTION
The CSD87588N NexFET™ power block II is a highly
optimized design for synchronous buck applications
offering high current and high efficiency capability in a
small 5-mm × 2.5-mm outline. Optimized for 5V gate
drive applications, this product offers an efficient and
flexible solution capable of providing a high density
power supply when paired with any 5V gate driver
from an external controller/driver.
TEXT ADDED FOR SPACING
ORDERING INFORMATION
Device
Package
Media Qty
CSD87588N
5 x 2.5 LGA
13-Inch
Reel
2500
Ship
Tape and
Reel
TEXT ADDED FOR SPACING
TEXT ADDED FOR SPACING
TYPICAL CIRCUIT
VDD
ENABLE
PWM
VDD
GND
ENABLE
PWM
Driver IC
BOOT
DRVH
VIN
TG
VSW
LL
DRVL
BG
PGND
CSD87588N
TYPICAL POWER BLOCK EFFICIENCY
and POWER LOSS
VIN
100
7
90
6
80
V_GS = 5V
5
V_IN = 12V
VOUT
70
V_OUT = 1.3V
L_OUT = 0.29µH
4
60
f_SW = 500kHz
3
T_A = 25ºC
50
2
40
1
30
0
5
10
15
20
Output Current (A)
0
25
G001
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
NexFET is a trademark of Texas Instruments.
2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2013, Texas Instruments Incorporated