CSD87353Q5D Datasheet, PDF (1/21 Pages) Texas Instruments – Synchronous Buck NexFET™ Power Block

CSD87353Q5D
www.ti.com
SLPS285C – AUGUST 2011 – REVISED OCTOBER 2011
Synchronous Buck NexFET™ Power Block
FEATURES
1
•2 V_IN up to 27V
• Half-Bridge Power Block
• 95% system Efficiency at 25A
• Up To 40A Operation
• High Frequency Operation (Up To 1.5MHz)
• High Density – SON 5-mm × 6-mm Footprint
• Optimized for 5V Gate Drive
• Low Switching Losses
• Ultra Low Inductance Package
• RoHS Compliant
• Halogen Free
• Pb-Free Terminal Plating
DESCRIPTION
The CSD87353Q5D NexFET™ power block is an
optimized design for synchronous buck applications
offering high current, high efficiency, and high
frequency capability in a small 5-mm × 6-mm outline.
Optimized for 5V gate drive applications, this product
offers a flexible solution capable of offering a high
density power supply when paired with any 5V gate
drive from an external controller/driver.
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Top View
V_IN 1
V_IN 2
T_G 3
P_GND
(Pin 9)
8 VSW
7 VSW
6 VSW
APPLICATIONS
• Synchronous Buck Converters
– High Frequency Applications
– High Current, High Duty Cycle Applications
• Multiphase Synchronous Buck Converters
• POL DC-DC Converters
• IMVP, VRM, and VRD Applications
T_GR 4
5 BG
P0116-01
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ORDERING INFORMATION
Device
Package
Media Qty
CSD87353Q5D
SON 5-mm × 6-mm
Plastic Package
13-Inch
Reel
2500
Ship
Tape and
Reel
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TYPICAL CIRCUIT
100
95
90
85
80
75
70
0
TYPICAL POWER BLOCK EFFICIENCY
and POWER LOSS
12
10
8
V_GS = 5V
V_IN = 12V
V_OUT = 3.3V
6
L_OUT = 0.68µH
f_SW = 500kHz
4
T_A = 25ºC
2
0
5 10 15 20 25 30 35 40
Output Current (A)
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
NexFET is a trademark of Texas Instruments.
2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2011, Texas Instruments Incorporated