CSD87330Q3D Datasheet, PDF (1/21 Pages) Texas Instruments – Synchronous Buck NexFET™ Power Block

CSD87330Q3D
www.ti.com
SLPS284B – AUGUST 2011 – REVISED SEPTEMBER 2011
Synchronous Buck NexFET™ Power Block
FEATURES
1
•2 Half-Bridge Power Block
• Up to 27V V_IN
• 90% System Efficiency at 15A
• Up to 20A Operation
• High Frequency Operation (Up To 1.5MHz)
• High Density – SON 3.3-mm × 3.3-mm
Footprint
• Optimized for 5V Gate Drive
• Low Switching Losses
• Ultra Low Inductance Package
• RoHS Compliant
• Halogen Free
• Pb-Free Terminal Plating
DESCRIPTION
The CSD87330Q3D NexFET™ power block is an
optimized design for synchronous buck applications
offering high current, high efficiency, and high
frequency capability in a small 3.3-mm × 3.3-mm
outline. Optimized for 5V gate drive applications, this
product offers a flexible solution capable of offering a
high density power supply when paired with any 5V
gate drive from an external controller/driver.
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Top View
V_IN 1
V_IN 2
T_G 3
T_GR 4
P_GND
(Pin 9)
8 VSW
7 VSW
6 VSW
5 BG
P0116-01
APPLICATIONS
• Synchronous Buck Converters
– High Frequency Applications
– High Current, Low Duty Cycle Applications
• Multiphase Synchronous Buck Converters
• POL DC-DC Converters
• IMVP, VRM, and VRD Applications
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ORDERING INFORMATION
Device
Package
Media Qty
CSD87330Q3D
SON
3.3-mm × 3.3-mm
Plastic Package
13-Inch
Reel
2500
Ship
Tape and
Reel
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TYPICAL CIRCUIT
100
90
80
70
60
50
40
0
TYPICAL POWER BLOCK EFFICIENCY
and POWER LOSS
6
5
V_GS = 5V
4
V_IN = 12V
V_OUT = 1.3V
L_OUT = 1.0µH
3
f_SW = 500kHz
T_A = 25ºC
2
1
0
5
10
15
20
Output Current (A)
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
NexFET is a trademark of Texas Instruments.
2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2011, Texas Instruments Incorporated