CSD86360Q5D_15 Datasheet, PDF (1/23 Pages) Texas Instruments – Synchronous Buck NexFET™ Power Block

CSD86360Q5D
www.ti.com
SLPS327A – SEPTEMBER 2012 – REVISED MAY 2013
Synchronous Buck NexFET™ Power Block
FEATURES
1
•2 Half-Bridge Power Block
• 91% system Efficiency at 25A
• Up To 50A Operation
• High Frequency Operation (Up To 1.5MHz)
• High Density – SON 5-mm × 6-mm Footprint
• Optimized for 5V Gate Drive
• Low Switching Losses
• Ultra Low Inductance Package
• RoHS Compliant
• Halogen Free
• Pb-Free Terminal Plating
APPLICATIONS
• Synchronous Buck Converters
– High Frequency Applications
– High Current, Low Duty Cycle Applications
• Multiphase Synchronous Buck Converters
• POL DC-DC Converters
• IMVP, VRM, and VRD Applications
DESCRIPTION
The CSD86360Q5D NexFET™ power block is an
optimized design for synchronous buck applications
offering high current, high efficiency, and high
frequency capability in a small 5-mm × 6-mm outline.
Optimized for 5V gate drive applications, this product
offers a flexible solution capable of offering a high
density power supply when paired with any 5V gate
drive from an external controller/driver.
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Top View
V_IN 1
V_IN 2
T_G 3
T_GR 4
P_GND
(Pin 9)
8 VSW
7 VSW
6 VSW
5 BG
P0116-01
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ORDERING INFORMATION
Device
Package
Media Qty
CSD86360Q5D
SON 5-mm × 6-mm
Plastic Package
13-Inch
Reel
2500
Ship
Tape and
Reel
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TYPICAL CIRCUIT
100
90
80
70
60
50
40
30
0
TYPICAL POWER BLOCK EFFICIENCY
and POWER LOSS
7
6
5
V_GS = 5V
4
V_IN = 12V
V_OUT = 1.3V
3
L_OUT = .29µH
f_SW = 500kHz
2
T_A = 25ºC
1
5
10
15
20
Output Current (A)
0
25
G001
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
NexFET is a trademark of Texas Instruments.
2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2012–2013, Texas Instruments Incorporated