CD5474AC02 Datasheet, PDF (1/9 Pages) Texas Instruments – QUADRUPLE 2-INPUT POSITIVE-NOR GATES

CD54ACT02, CD74ACT02
QUADRUPLE 2-INPUT POSITIVE-NOR GATES
D Inputs Are TTL-Voltage Compatible
D Speed of Bipolar F, AS, and S, With
Significantly Reduced Power Consumption
D Balanced Propagation Delays
D ±24-mA Output Drive Current
– Fanout to 15 F Devices
D SCR-Latchup-Resistant CMOS Process and
Circuit Design
D Exceeds 2-kV ESD Protection Per
MIL-STD-883, Method 3015
SCHS309B – JANUARY 2001 – REVISED MAY 2002
CD54ACT02 . . . F PACKAGE
CD74ACT02 . . . E OR M PACKAGE
(TOP VIEW)
1Y ₁
1A 2
1B 3
2Y 4
2A 5
2B 6
GND 7
14 ^V_CC
13 4Y
12 4B
11 4A
10 3Y
9 3B
8 3A
description
The ’ACT02 devices contain four independent 2-input NOR gates that perform the Boolean function Y = A S B
or Y = A + B in positive logic.
ORDERING INFORMATION
TA
PACKAGE†
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING
PDIP – E Tube
CD74ACT02E
CD74ACT02E
Tube
–55°C to 125°C SOIC – M
Tape and reel
CD74ACT02M
CD74ACT02M96
ACT02M
CDIP – F Tube
CD54ACT02F3A CD54ACT02F3A
† _{Package drawings, standard packing quantities, thermal data, symbolization, and PCB design}
guidelines are available at www.ti.com/sc/package.
FUNCTION TABLE
(each gate)
INPUTS
A
B
OUTPUT
Y
H
X
L
X
H
L
L
L
H
logic diagram (positive logic)
2
1A
3
1B
5
2A
6
2B
1
1Y
4
2Y
8
3A
9
3B
11
4A
12
4B
10
3Y
13
4Y
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
• POST OFFICE BOX 655303 DALLAS, TEXAS 75265
Copyright  2002, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
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