AFE8405 Datasheet, PDF (1/152 Pages) Texas Instruments – 14-BIT, 85-MSPS, SINGLE-ADC, 8-CHANNEL WIDEBAND RECEIVER

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1 Introduction
AFE8405
14-BIT, 85-MSPS, SINGLE-ADC, 8-CHANNEL WIDEBAND RECEIVER
SLWS212 – OCTOBER 2008
1.1 FEATURES
• 14-Bit 85-MSPS High-Performance Single ADC
• At f_in = 140 MHz, SNR ≥ 71 dBFS,
SFDR ≥ 79 dBc
• At f_in = 70 MHz, SNR ≥ 73 dBFS,
SFDR ≥ 85 dBc
• Independent Clocks for ADC and DDC With
Built-In FIFO
• Programmable Closed-Loop VGA Control With
6-Bit Outputs for ADC
• Received Total Wideband Power (RTWP)
Measurement for the Composite Power Across
Carriers With Programmable Time Window for
Measurement
• 8 UMTS Digital Downconverter (DDC)
Channels or 16 CDMA/TD-SCDMA DDC
Channels With Programmable 18-Bit Filter
Coefficients
• Each DDC Channel Provides:
– Real or Complex DDC Inputs
– UMTS Mode Rx Filtering: 6-Stage CIC (m =
1 or 2), up to 40-Tap CFIR, up to 64-Tap
PFIR
– CDMA Mode Rx Filtering: 6-Stage CIC (m =
1 or 2), up to 64-Tap CFIR, up to 64-Tap
PFIR
– Individual Channel-Specific Power
Measurements
– A Dedicated Final AGC
• Test Bus to Monitor Data at Different Stages of
the DDC Signal Path
• 3.3-V Analog Supplies, 1.5-V Digital Core
Supply, 3.3-V Digital I/O Supply
• 484-Ball Plastic BGA (23 mm × 23 mm) With
1,0-mm Pitch
• Power Dissipation (Eight Active DDC
Channels): 2.3 W
1.2 APPLICATIONS
• Wireless Base Station Receiver
• Multi-Carrier Digital Receiver
• UMTS (8 Carriers-1 Sector)
• CDMA (16 Carriers-1 Sector)
• TD-SCDMA (16 Carriers-1 Sector)
• Digital Radio Receivers
• Wideband Receivers
• Software Radios
• Wireless Local Loop
• Intelligent Antenna Systems
Contents
1 Introduction ............................................... 1
1.1 FEATURES ........................................... 1
1.2 APPLICATIONS ...................................... 1
2 General Description ..................................... 3
3 SPECIFICATIONS ........................................ 4
3.1 PACKAGE ORDERING INFORMATION ............. 4
3.2 ABSOLUTE MAXIMUM RATINGS ................... 4
3.3 RECOMMENDED OPERATING CONDITIONS...... 4
3.4 THERMAL CHARACTERISTICS ..................... 5
3.5 POWER DISSIPATION............................... 5
3.6 ANALOG ELECTRICAL CHARACTERISTICS ....... 6
3.7 DIGITAL CHIP DC CHARACTERISTICS ............ 8
3.8 DIGITAL CHIP AC TIMING CHARACTERISTICS ... 9
4 AFE8405 PINS........................................... 10
4.1 Analog Section Signals.............................. 10
4.2 Digital Receive Section Signals ..................... 11
4.3 Microprocessor Signals ............................. 14
4.4 JTAG Signals........................................ 15
4.5 Factory Test and No-Connect Signals .............. 15
4.6 Power and Ground Signals.......................... 15
4.7 Digital Supply Monitoring............................ 16
4.8 JTAG ................................................ 16
5 Typical Characteristics................................ 17
6 ANALOG-TO-DIGITAL CONVERTERS.............. 24
6.1 ADC Operation ...................................... 24
6.2 ADC Input Configuration ............................ 24
6.3 ADC Input Voltage Overstress ...................... 28
6.4 ADC Reference Circuit .............................. 28
6.5 ADC Clock Input..................................... 28
7 RECEIVE DIGITAL SIGNAL PROCESSING ........ 30
7.1 Receive Input Interface.............................. 30
7.2 DDC Organization................................... 43
8 AFE8405 GENERAL CONTROL...................... 73
8.1 Microprocessor Interface Control Data, Address,
and Strobes ......................................... 73
8.2 Synchronization Signals............................. 76
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this document.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2008, Texas Instruments Incorporated