74ACT11112 Datasheet, PDF (1/5 Pages) Texas Instruments – DUAL J-K NEGATIVE-EDGE-TRIGGERED FLIP-FLOP WITH CLEAR AND PRESET

74ACT11112
DUAL J-K NEGATIVE-EDGE-TRIGGERED FLIP-FLOP
WITH CLEAR AND PRESET
SCAS064A – D3339, JUNE 1989 – REVISED APRIL 1993
• Inputs Are TTL-Voltage Compatible
• Fully Buffered to Offer Maximum Isolation
From External Disturbance
• Flow-Through Architecture Optimizes
PCB Layout
• Center-Pin V_CC and GND Configurations
Minimize High-Speed Switching Noise
t • EPIC (Enhanced-Performance Implanted
CMOS) 1-mm Process
• 500-mA Typical Latch-Up Immunity at 125°C
• Package Options Include Plastic
Small-Outline Packages and Standard
Plastic 300-mil DIPs
D OR N PACKAGE
(TOP VIEW)
1PRE 1
1Q 2
1Q 3
GND 4
2Q 5
2Q 6
2PRE ⁷
2J ⁸
16 1J
15 1K
14 1CLK
13 1CLR
12 V_CC
11 2CLR
10 2CLK
9 _2K
description
This device contains two independent J-K negative-edge-triggered flip-flops. A low level at the PRE or CLR
input sets or resets the outputs regardless of the levels of the other inputs. When PRE and CLR are inactive
(high), data at the J and K inputs meeting the setup time requirements are transferred to the outputs on the
negative-going edge of the clock pulse. Clock triggering occurs at a voltage level and is not directly related to
the fall time of the clock pulse. Following the hold-time interval, data at the J and K inputs may be changed
without affecting the levels at the outputs. These versatile flip-flops can perform as toggle flip-flops by tying
J and K high.
The 74ACT11112 is characterized for operation from – 40°C to 85°C.
FUNCTION TABLE
INPUTS
OUTPUTS
PRE CLR CLK J K Q Q
L
H
X
XXHL
H
L
X
XXLH
L
L
X X X H^{ H^{
H
H
↓
L
L Q0 Q0
H
H
↓
HLHL
H
H
↓
LHLH
H
H
↓
H H TOGGLE
H
H
H
X X Q0 Q0
† _{This configuration is nonstable; that is, it will not}
persist when either PRE or CLR returns to the
inactive (high) level.
EPIC is a trademark of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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Copyright © 1993, Texas Instruments Incorporated
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