U4935B Datasheet, PDF (4/16 Pages) TEMIC Semiconductors – SECAM Decoder

U4935B
Parameters
Test Conditions / Pins
Symbol Min.
Ratio of –(B–Y)/–(R–Y) output
signal amplitude
Linearity
V_B–Y/V_B– 1.10
Y
(see notes 1 and 3, page 5)
V_LIN
2.6
Pin 10
Sandcastle pulse (see figures 16 and 17)
Vertical blanking detection level
Horizontal blanking detection level
Burst-gate detection level
Reference/ Identification
Pin 15 V_VB
1.0
Pin 15 V_HB
1.75
Pin 15 V_BG
3.5
Reference frequency
During vertical blanking
f_ref
(see figure 4, 300 mVpp)
Pin 1
System switches detection level
(at SECAM)
V_ext1 = variable
(see figure 6),
Pin 1
V_TH1
System switches detection level
(at no SECAM)
V_ext1 = variable
(see figure 6),
V_TH2
1.5
Pin 1
Sink current (at SECAM)
(see note 5, page 5), Pin 1
125
Pin 5 voltage (at SECAM)
Sensitivity of identification and
killer
(see note 1, page 5), Pin 5
V_5S
2.4
Attenuate the amplitude
I/K
–46
(see notes 1 and 6, page 5)
Pin 5
Unspecified characteristics (only for reference but not guaranteed limiting values)
Input dynamic range
(peak-to-peak value)
Pin 16 V_DR
Chrominance input voltage
(peak-to-peak value)
(see note 7, page 5), Pin 16
V_CL
Pole frequency of the de-emphasis
f_p
LPF
Ratio of the pole and zero
f_p/f_o
frequency
–(R–Y), –(B–Y) output impedance
(at SECAM)
Pins 9 and 10
Z_o1
–(R–Y), –(B–Y) output impedance
(at no SECAM)
Pins 9 and 10
Z_o2
1
Reference voltage amplitude
(peak-to-peak value)
(see note 8, page 5), Pin 1
V_ref
0.2
Rising edge of SECAM burst-gate (see note 9, page 5)
T_r
pulse (internal generated)
Falling edge of SECAM burst-gate (see note 10, page 5)
T_f
pulse
Typ. Max.
1.24 1.36
2.9 3.2
1.25 1.4
2.0 2.25
3.85 4.2
4.4336
2.9 3.3
2.0
180 235
3.1 3.6
–38 –32
1.0 1.4
167 300
85
3
200 600
0.57
4.5
0.2
Unit
V
V
V
MHz
V
V
mA
V
dB
V
mV
kHz
W
MW
V
ms
ms
4 (16)
TELEFUNKEN Semiconductors
Preliminary Information
Rev. A1, 28-Jan-97