TSL2581 Datasheet, PDF (4/32 Pages) TEXAS ADVANCED OPTOELECTRONIC SOLUTIONS – LIGHT-TO-DIGITAL CONVERTER

TSL2581, TSL2583
LIGHT-TO-DIGITAL CONVERTER
TAOS134 − MARCH 2011
Electrical Characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
I_DD Supply current
V_OL INT, SDA output low voltage
I _LEAK Leakage current
TEST CONDITIONS
Active
Power down — I²C activity
3 mA sink current
6 mA sink current
MIN TYP MAX UNIT
175 250 μA
3
10 μA
0
0.4 V
0
0.6 V
−5
5 μA
Operating Characteristics, V_DD = 3 V, T_A = 255C, (unless otherwise noted) (Notes 1, 2, 3, and 4)
PARAMETER
TEST CONDITIONS
CHANNEL
MIN TYP MAX UNIT
f_osc Oscillator frequency
Dark ADC count value
E_e = 0, ATIME = 0xB6 (200 ms),
gain = 16×
705 750 795 kHz
Ch0
0
1
5
counts
Ch1
0
1
5
Ch0
ATIME = 0xDB (100 ms)
Ch1
Full scale ADC count value
Ch0
ATIME = 0x6C (400 ms)
Ch1
37887
37887
65535
65535
counts
ADC count value
λ_p = 625 nm, ATIME = 0xF6 (27 ms)
Ch0
E_e = 171.6 μW/cm², gain = 16×
Ch1
λ_p = 850 nm, ATIME = 0xF6 (27 ms)
Ch0
E_e = 220 μW/cm², gain = 16×
Ch1
4000
4000
5000
700
5000
2750
6000
counts
6000
ADC count value ratio: Ch1/Ch0
λ_p = 625 nm
λ_p = 850 nm
R_e Irradiance responsivity
Ch0
λ_p = 625 nm, ATIME = 0xF6 (27 ms)
Ch1
Ch0
λ_p = 850 nm, ATIME = 0xF6 (27 ms)
Ch1
10.8 15.8 20.8
%
41
55
68
29.1
4
counts/
(μW/
22.8
cm²)
12.5
Ch0
7
8
9
8×
Ch1
7
8
9
Gain scaling (relative to 1×)
16×
Ch0
15
16
17
×
Ch1
15
16
17
111×
Ch0
97 107 115
Ch1
100 115 125
NOTES: 1. Optical measurements are made using small-angle incident radiation from light-emitting diode optical sources. Visible 640 nm LEDs
and infrared 850 nm LEDs are used for final product testing for compatibility with high-volume production.
2. The 625 nm irradiance E_e is supplied by an AlInGaP light-emitting diode with the following characteristics: peak wavelength
λp = 625 nm and spectral halfwidth Δλ½ = 20 nm.
3. The 850 nm irradiance E_e is supplied by a light-emitting diode with the following characteristics: peak wavelength
λp = 850 nm and spectral halfwidth Δλ½ = 42 nm.
4. The integration time T_int, is dependent on internal oscillator frequency (f_osc) and on the number of integration cycles (ATIME) in the
Timing Register (0xFF) as described in the Register section. For nominal f_osc = 750 kHz, nominal T_int = 2.7 ms × ATIME.
Copyright E 2011, TAOS Inc.
4
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www.taosinc.com
The LUMENOLOGY r Company
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