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TL760M33-Q1 Datasheet, PDF (2/12 Pages) Texas Instruments – LOW-DROPOUT FIXED-VOLTAGE REGULATORS
TL760M33-Q1
SGLS284I – OCTOBER 2005 – REVISED DECEMBER 2010
www.ti.com
ABSOLUTE MAXIMUM RATINGS(1)
over operating virtual junction temperature range (unless otherwise noted)
VI
Maximum input voltage
TJ
Operating virtual junction temperature
Tstg Storage temperature range
45 V
150°C
–65°C to 150°C
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
PACKAGE THERMAL DATA(1)
PACKAGE
TO-252 (KVU)
TO-263 (KTT)
BOARD
High K, JESD 51-5
High K, JESD 51-5
qJA
30.3°C/W
26.9°C/W
(1) Maximum power dissipation is a function of TJ(max), qJA, and TA. The maximum allowable power dissipation at any allowable ambient
temperature is PD = (TJ(max) – TA)/qJA. Operating at the absolute maximum TJ of 150°C can impact reliability.
THERMAL RESISTANCE
1-oz copper, one-layer PCB
THERMAL RESISTANCE
RJA
RJC
RJC
VALUE
55°C/W (area = 240 mm2)
5.5°C/W from FET to tab
0.1°C/W from die center to tab
RECOMMENDED OPERATING CONDITIONS
VI
Input voltage
IO
Output current
TJ
Operating virtual-junction temperature
MIN MAX UNIT
3.8
26 V
0 500 mA
–40 150 °C
ELECTRICAL CHARACTERISTICS
VI = 6 V, IO = 500 mA, TJ = –40°C to 150°C (unless otherwise noted)
PARAMETER
TEST CONDITIONS(1)
VO
Output voltage
IQ
Current consumption, IQ = II – IO
Line regulation
PSRR Power-supply ripple rejection
Load regulation
VDO Dropout voltage(2)
IO = 5 mA to 500 mA, VI = 3.8 V to 26 V, TJ = 125°C
TJ = 150°C, IO = 5 mA to 300 mA, VI = 3.8 V to 26 V
VI = 6 V
IO = 250 mA
IO = 500 mA
VI = 3.8 V to 28 V
f = 100 Hz, Vripple = 0.5 VPP, VI = 6 V
IO = 5 mA to 500 mA
IO = 250 mA
IO = 500 mA
MIN TYP MAX UNIT
3.2 3.3 3.4
V
3.2 3.3 3.4
8
15
mA
20
30
10
25 mV
62
dB
5
30 mV
400
mV
500
(1) Pulse-testing techniques are used to maintain the virtual junction temperature as close to the ambient temperature as possible. Thermal
effects must be taken into account separately. All characteristics are measured with a 0.1-mF capacitor across the input and a 22-mF
tantalum capacitor, with equivalent series resistance of 1.5 Ω on the output.
(2) Measured when the output voltage, VO, has dropped 100 mV from the nominal value obtained when VI = 6 V
2
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