MC1558 Datasheet, PDF (1/4 Pages) Texas Instruments – DUAL GENERAL-PURPOSE OPERATIONAL AMPLIFIER

MC1558-DIE
www.ti.com
SLOS847 – APRIL 2013
DUAL GENERAL-PURPOSE OPERATIONAL AMPLIFIER
Check for Samples: MC1558-DIE
FEATURES
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• Short-Circuit Protection
• Wide Common-Mode and Differential Voltage
Ranges
• No Frequency Compensation Required
• Low Power Consumption
• No Latch-Up
DESCRIPTION
The MC1558-DIE is a dual general-purpose operational amplifier, with each half electrically similar to the μA741,
except that offset null capability is not provided.
The high-common-mode input voltage range and the absence of latch-up make this amplifier ideal for voltage-
follower applications. The MC1558-DIE is short-circuit protected and the internal frequency compensation
ensures stability without external components.
PRODUCT
MC1558
PACKAGE
DESIGNATOR
TD
ORDERING INFORMATION⁽¹⁾
PACKAGE
ORDERABLE PART NUMBER
Bare die in waffle pack⁽²⁾
MC1558TDC1
MC1558TDC2
PACKAGE QUANTITY
400
10
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
(2) Processing is per the Texas Instruments commercial production baseline and is in compliance with the Texas Instruments Quality
Control System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room
temperature only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not
warranted. Visual Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2013, Texas Instruments Incorporated