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HV21716 Datasheet, PDF (1/10 Pages) Supertex, Inc – Low Charge Injection 8-Channel High Voltage Analog Switch
– OBSOLETE –
Low Charge Injection
8-Channel High Voltage Analog Switch
HV21716
HV21816
Ordering Information
Package Options
Operating
V
PP
40V to 80V
VPP – VNN
160V
28-lead plastic
chip carrier
HV21716PJ
Die
HV21716X
80V to 150V
160V
HV21816PJ
HV21816X
Features
■ HVCMOS® technology for high performance
■ Low charge injection
■ Very low quiescent power dissipation – 10µA
■ Output On-resistance typically 22 ohms
■ Low parasitic capacitances
■ DC to 10MHz analog signal frequency
■ -50dB typical output off isolation at 5MHz
■ CMOS logic circuitry for low power
■ Excellent noise immunity
■ On-chip shift register and latch logic circuitry
■ Flexible high voltage supplies
■ Surface mount package available
General Description
Not recommended for new designs. Please use HV20220 for
all new designs.
This device is a low charge injection 8-channel high-voltage ana-
log switch integrated circuit (IC) intended for use in applications
requiring high voltage switching controlled by low voltage control
signals, such as ultrasound imaging and printers. Input data is
shifted into an 8-bit shift register which can then be retained in an
8-bit latch. To reduce any possible clock feedthrough noise, Latch
Enable (LE) should be left high until all bits are clocked in. Using
HVCMOS technology, this switch combines high voltage bilateral
DMOS switches and low power CMOS logic to provide efficient
control of high voltage analog signals.
Absolute Maximum Ratings*
VDD logic power supply voltage
VPP - VNN supply voltage
VPP positive high voltage supply
VNN negative high voltage supply
Logic input voltages
Analog signal range
Peak analog signal current/channel
Storage temperature
Power dissipation
-0.5V to +18V
174V
-0.5V to +160V
+0.5V to -160V
-0.5V to VDD +0.3V
VNN to VPP
3.0A
-65°C to +150°C
1.2W
* Absolute Maximum Ratings are those values beyond which damage to the
device may occur. Functional operation under these conditions is not implied.
Continuous operation of the device at the absolute rating level may affect
device reliability.
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