HV2116 Datasheet, PDF (1/9 Pages) Supertex, Inc – 8-Channel High Voltage Analog Switch

HV2116
8-Channel High Voltage Analog Switch
Ordering Information
V_PP – V_NN
Package Options
28-lead plastic
Die
chip carrier
160V
Features
HV2116PJ
HV2116X
– ^{OBSOLETE – General Description}
■ HVCMOS^® technology for high performance
■ Very low quiescent power dissipation – 10µA
■ Output On-resistance typically 22 ohms
■ Low parasitic capacitances
■ DC to 10MHz analog signal frequency
■ -50dB typical output off isolation at 5MHz
■ CMOS logic circuitry for low power
■ Excellent noise immunity
■ On-chip shift register, and latch logic circuitry
■ Flexible high voltage supplies
■ Surface mount package available
Not recommended for new designs. Please use HV202
instead.
This device is an 8-channel high-voltage analog switch integrated
circuit (IC) intended for use in applications requiring high voltage
switching controlled by low voltage control signals, such as ultra-
sound imaging and printers. Input data is shifted into an 8-bit shift
register which can then be retained in an 8-bit latch. To reduce
any possible clock feedthrough noise, Latch Enable (LE) should
be left high until all bits are clocked in. Using HVCMOS technol-
ogy, this switch combines high voltage bilateral DMOS switches
and low power CMOS logic to provide efficient control of high
voltage analog signals.
This IC is suitable for various combinations of high voltage sup-
plies, e.g., for HV2116 +40V/-120V, or +80V/-80V or +150V/-10V.
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Absolute Maximum Ratings*
V_DDlogic power supply voltage
V_PP - V_NN supply voltage
V_PP positive high voltage supply
V_NN Negative high voltage supply
Logic input voltages
Analog signal range
Peak analog signal current/channel
Storage temperature
Power dissipation
-0.5V to +18V
174V
-0.5V to +160V
+0.5V to -160V
-0.5V to V_DD +0.3V
V_NN to V_PP
3.0A
-65°C to +150°C
1.2W
*Absolute Maximum Ratings are those values beyond which damage to the
device may occur. Functional operation under these conditions is not implied.
Continuous operation of the device at the absolute rating level may affect
device reliability.
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