L201610 Datasheet, PDF (4/7 Pages) Superworld Electronics – FERRITE CHIP INDUCTORS

FERRITE CHIP INDUCTORS
7. RELIABILITY & TEST CONDITION :
ITEM
PERFORMANCE
Bending Strength
The ferrite should not be damaged by forces
applied on the right condition.
R0.5(0.02)
1.0(0.039)
Chip
A
L201610 SERIES
TEST CONDITION
Size
L201610
mm (inches)
1.40(0.055)
P-Kgf
1.0
Random Vibration Test
Appearance : Cracking, Chipping & any other
defects harmful to the characteristics should
not be allowed.
Inductance: within±30%
Drop
No mechanical damage
Inductance change : within±10%
Life testing at high temperature Appearance : No damage.
Temperature
Inductance : Within ±10% of initial value.
Humidity
Thermal Shock
Appearance : No damage.
Inductance : Within ±10% of initial value.
Phase
1
2
3
Temperature (°C)
-40±2°C
room temp
+105±2°C
Times (min.)
30±5
<0.5
30±5
Measured : 500 times
Frequency : 10-55-10Hz for 15 min.
Amplitude : 1.52mm
Directions & times : X, Y, Z directions for 15 mins
This cycle shall be performed 12 times in each of three
mutually perpendicular direction.(Total 9 hours)
Drop 10 times on a concrete floor from a
height of 75cm.
Temperature : 105±2°C
Applied Current : rated current
Duration : 1008±12hrs
Measured at room temperature after placing for 2 to 3hrs.
Humidity : 90~95% RH.
Temperature : 40±2°C
Duration : 504±8hrs
Measured at room temperature after placing for 2 to 3hrs.
Condition for 1 cycle
Step1 : -40±2°C 30±5 min.
Step2 : +105±5°C 30±5 min.
Number of cycles : 500
Measured at room temperature after placing for 2 to 3hrs.
Low temperature storage test
Appearance : No damage.
Inductance : Within ±30% of initial value.
Temperature : -40±2°C
Duration : 500±8hrs
Measured at room temperature after placing for 2 to 3hrs.
NOTE : Specifications subject to change without notice. Please check our website for latest information.
13.10.2011
SUPERWORLD ELECTRONICS (S) PTE LTD
PG. 4