TS18 Datasheet, PDF (2/10 Pages) Suntan Capacitors – MULTILAYER CERAMIC CHIP CAPACITOR - SMD

MULTILAYER CERAMIC CHIP CAPACITOR - SMD
TS18
Suntan®
Specification and Test Condition：
1. Appearance
Dielectrics
Specification
NPO/X7R/X5R/Y5V
2. Dimensions
Dielectrics
No defects or abnormalities
Specification
NPO/X7R/X5R/Y5V ^{Within the specified dimensions}
3. Capacitance
Dielectrics
NPO
X7R/X5R
Specification
Within the specified tolerance
B:±0.1pF;C:±0.25pF;D:±0.5pF;J:
±5%
Within the specified tolerance
J: ±5%；K: ±10%； M: ±20%
Within the specified tolerance
Y5V
M: ±20%; Z: -20%, +80%
4. Dissipation Factor
Dielectrics
NPO
X7R/X5R
Y5V
Specification
Cp<30pF, Q≥400+20Cp;
Cp≥30pF, Q≥1000
U_R≥25V, DF ≤2.5%
U_R =16V, DF ≤3.5%
U_R ≤10V, DF ≤5.0%
U_R≥25V, DF ≤7.0% (C<1.0μF)
DF ≤9.0% (C≥1.0μF)
U_R =16V, DF ≤9.0%
U_R ≤10V, DF ≤12.5%
Testing Condition
Visual inspection.
Testing Condition
Using calipers on micrometer
Testing Condition
1.0±0.2Vrms, 1MHz±10%
(C>1000 pF, 1.0±0.2Vrms, 1KHz±10%，)
25℃。
1.0±0.2Vrms, 1KHz±10%
（Cp＞10uF,0.5±0.1Vrms,120±24Hz）
at 25℃,48hrs after annealing
1.0±0.2Vrms, 1KHz±10%
（Cp＞10uF,0.5±0.1Vrms,120±24Hz）
at 25℃, 48hrs after annealing
Testing Condition
1.0±0.2Vrms,1MHz±10% ,25℃
(Cp>1000pF,1.0±0.2Vrms,1KHz±10%)
1.0±0.2Vrms, 1KHz±10%,
(Cp＞10uF,0.5±0.1Vrms,120±24Hz)
at 25℃,48hrs after annealing
1.0±0.2Vrms, 1KHz±10%,
(Cp＞10uF,0.5±0.1Vrms,120±24Hz)
at 25℃,48hrs after annealing
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