S93WD462_98 Datasheet, PDF (7/14 Pages) Summit Microelectronics, Inc. – Precision Supply-Voltage Monitor and Reset Controller With a Watchdog Timer and 1k-bit Microwire Memory

S93WD462/S93WD463
ABSOLUTE MAXIMUM RATINGS*
Temperature Under Bias .................................................................................................................................... –55°C to +125°C
Storage Temperature ......................................................................................................................................... –65°C to +150°C
Voltage on any Pin with Respect to Ground⁽¹⁾ ............................................................................................. –2.0V to +VCC +2.0V
VCC with Respect to Ground .................................................................................................................................. –2.0V to +7.0V
Package Power Dissipation Capability (Ta = 25°C) ............................................................................................................. 1.0W
Lead Soldering Temperature (10 secs) .............................................................................................................................. 300°C
Output Short Circuit Current⁽²⁾ ........................................................................................................................................... 100 mA
*COMMENT
Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional
operation of the device at these or any other conditions outside of those listed in the operational sections of this specification is not implied. Exposure to
any absolute maximum rating for extended periods may affect device performance and reliability.
RECOMMENDED OPERATING CONDITIONS
Temperature
Commercial
Industrial
RELIABILITY CHARACTERISTICS
Min
0°C
-40°C
Max
+70°C
+85°C
2029 PGM T7.0
Symbol
Parameter
Min. Max.
Units
Reference Test Method
NEND(3)
Endurance
1,000,000
Cycles/Byte MIL-STD-883, Test Method 1033
TDR(3)
Data Retention
100
Years
MIL-STD-883, Test Method 1008
VZAP(3)
ESD Susceptibility
2000
Volts
MIL-STD-883, Test Method 3015
ILTH(3)(4) Latch-Up
100
mA
JEDEC Standard 17
2029 PGM T2.1
D.C. OPERATING CHARACTERISTICS (over recommended operating conditions unless otherwise specified)
Limits
Symbol
Parameter
Min.
Typ.
Max.
Units
Test Conditions
ICC
Power Supply Current
(Operating)
3
mA DI = 0.0V, fSK = 1MHz
V_CC = 5.0V, CS = 5.0V,
Output Open
ISB
Power Supply Current
(Standby)
50
µA CS = 0V
Reset Outputs Open
ILI
Input Leakage Current
I_LO
Output Leakage Current
(Including ORG pin)
2
µA VIN = 0V to VCC
10
µA V_OUT = 0V to V_CC,
CS = 0V
VIL1
Input Low Voltage
-0.1
VIH1
Input High Voltage
2
0.8
VCC+1
V 4.5V≤VCC<5.5V
V
VIL2
Input Low Voltage
V_IH2
Input High Voltage
0
V_CCX0.7
VCCX0.2
V_CC+1
V 1.8V≤VCC<2.7V
V
VOL1
Output Low Voltage
V_OH1
Output High Voltage
2.4
0.4
V 4.5V≤VCC<5.5V
V
I_OL = 2.1mA
IOH = -400µA
VOL2
VOH2
Output Low Voltage
Output High Voltage
VCC-0.2
0.2
V 1.8V≤VCC<2.7V
V
IOL = 1mA
IOH = -100µA
2029 PGM T3.0
Note:
(1) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20 ns. Maximum DC
voltage on output pins is V_CC +0.5V, which may overshoot to V_CC +2.0V for periods of less than 20 ns.
(2) Output shorted for no more than one second. No more than one output shorted at a time.
(3) This parameter is tested initially and after a design or process change that affects the parameter.
(4) Latch-up protection is provided for stresses up to 100 mA on address and data pins from –1V to V_CC +1V.
2029-01 4/14/98
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