STM32L151CBT6 Datasheet, PDF (98/121 Pages) STMicroelectronics – Ultra-low-power 32-bit MCU ARM-based Cortex-M3, 128KB Flash, 16KB SRAM, 4KB EEPROM, LCD, USB, ADC, DAC

Electrical characteristics
STM32L151x6/8/B, STM32L152x6/8/B
4. Difference between measured value at Code i and the value at Code i on a line drawn between Code 0 and
last Code 4095.
5. Difference between the value measured at Code (0x800) and the ideal value = V_REF+/2.
6. Difference between the value measured at Code (0x001) and the ideal value.
7. Difference between ideal slope of the transfer function and measured slope computed from code 0x000 and
0xFFF when buffer is OFF, and from code giving 0.2 V and (V_DDA – 0.2) V when buffer is ON.
8. In buffered mode, the output can overshoot above the final value for low input code (starting from min value).
Figure 30. 12-bit buffered /non-buffered DAC
Buffered/Non-buffered DAC
Buffer(1)
12-bit
digital to
analog
converter
DAC_OUTx
R _LOAD
C _LOAD
ai17157V2
1. The DAC integrates an output buffer that can be used to reduce the output impedance and to drive external loads directly
without the use of an external operational amplifier. The buffer can be bypassed by configuring the BOFFx bit in the
DAC_CR register.
6.3.18 Temperature sensor characteristics
Table 58. Temperature sensor characteristics
Symbol
Parameter
Min
Typ
Max
Unit
T_L(1)
Avg_Slope⁽¹⁾
V₁₁₀
I_DDA(TEMP)⁽³⁾
t_START(3)
T_{S_temp(4)(3)}
V_SENSE linearity with temperature
Average slope
Voltage at 110°C ±5°C⁽²⁾
Current consumption
Startup time
ADC sampling time when reading the
temperature
1.48
612
10
±1
1.61
626.8
3.4
±2
1.75
641.5
6
10
°C
mV/°C
mV
µA
µs
1. Guaranteed by characterization, not tested in production.
2. Measured at V_DD = 3 V ±10 mV. V110 ADC conversion result is stored in the TSENSE_CAL2 byte.
3. Guaranteed by design, not tested in production.
4. Shortest sampling time can be determined in the application by multiple iterations.
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