ISB35000 Datasheet, PDF (9/15 Pages) STMicroelectronics – HCMOS STRUCTURED ARRAY

ISB35000 SERIES
EVALUATION DEVICE
An evaluation device is used to demonstrate the
performance of the ISB35000 series as well as
verify the effectiveness of the design system. The
device has path delays, latches, a host of macro-
cells and embedded functions which were used to
verify the simulated characteristics that are supplied
in the data book. Characterization of the path delays
including interconnect shows typical delays of 210
ps for a 2 input NAND with receivers/drivers oper-
ating at frequencies of 200 MHz. The evaluation
device is available in a 208 pin plastic quad flat pack.
Figure 5. Evaluation Device
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