ST72E311 Datasheet, PDF (86/100 Pages) STMicroelectronics – 8-BIT MCU WITH 8 TO 16K OTP/EPROM, 384 TO 512 BYTES RAM, ADC, WDG, SCI, SPI AND 2 TIMERS

ST72E311 ST72T311
6 ELECTRICAL CHARACTERISTICS
6.1 ABSOLUTE MAXIMUM RATINGS
This product contains devices to protect the inputs
against damage due to high static voltages, how-
ever it is advisable to take normal precaution to
avoid application of any voltage higher than the
specified maximum rated voltages.
For proper operation it is recommended that V_I
and V_O be higher than V_SS and lower than V_DD.
Reliability is enhanced if unused inputs are con-
nected to an appropriate logic voltage level (V_DD
or V_SS).
Power Considerations.The average chip-junc-
tion temperature, T_J, in Celsius can be obtained
from:
T_J= TA + PD x RthJA
Where: T_A = Ambient Temperature.
RthJA = Package thermal resistance
(junction-to ambient).
P_D = P_INT + P_PORT.
P_INT = I_DD x V_DD (chip internal power).
P_PORT =Port power dissipation
determined by the user)
Symbol
V_DD
V_DDA
V_I
V_AI
V_O
IV_DD
IV_SS
T_J
T_STG
Parameter
Digital Supply Voltage
Analog Supply and Reference Voltage
Input Voltage
Analog Input Voltage (A/D Converter)
Output Voltage
Total Current into V_DD (source)
Total Current out of V_SS (sink)
Junction Temperature
Storage Temperature
Value
-0.3 to 6.0
V_DD - 0.3 to V_DD + 0.3
V_SS - 0.3 to V_DD + 0.3
V_SS - 0.3 to V_DD + 0.3
V_SSA-0.3 to V_DDA+0.3
V_SS - 0.3 to V_DD + 0.3
100
100
150
-60 to 150
Unit
V
V
V
V
V
mA
mA
°C
°C
Note: Stresses above those listed as “absolute maximum ratings” may cause permanent damage to the device. This is
a stress rating only and functional operation of the device at these conditions is not implied. Exposure to maximum
rating conditions for extended periods may affect device reliability.
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