STM32L041X4 Datasheet, PDF (78/119 Pages) STMicroelectronics – Access line ultra-low-power 32-bit MCU ARM-based Cortex-M0+, up to 32KB Flash, 8KB SRAM, 1KB EEPROM, ADC, AES

Electrical characteristics
STM32L041x4/6
6.3.12
These tests are compliant with EIA/JESD 78A IC latch-up standard.
Table 51. Electrical sensitivities
Symbol
Parameter
Conditions
LU
Static latch-up class T_A = +125 °C conforming to JESD78A
Class
II level A
I/O current injection characteristics
As a general rule, current injection to the I/O pins, due to external voltage below V_SS or
above V_DD (for standard pins) should be avoided during normal product operation.
However, in order to give an indication of the robustness of the microcontroller in cases
when abnormal injection accidentally happens, susceptibility tests are performed on a
sample basis during device characterization.
Functional susceptibility to I/O current injection
While a simple application is executed on the device, the device is stressed by injecting
current into the I/O pins programmed in floating input mode. While current is injected into
the I/O pin, one at a time, the device is checked for functional failures.
The failure is indicated by an out of range parameter: ADC error above a certain limit (higher
than 5 LSB TUE), out of conventional limits of induced leakage current on adjacent pins (out
of –5 µA/+0 µA range), or other functional failure (for example reset occurrence oscillator
frequency deviation).
The test results are given in the Table 52.
Symbol
Table 52. I/O current injection susceptibility
Functional susceptibility
Description
Negative
Positive
Unit
injection
injection
Injected current on BOOT0
-0
Injected current on PA0, PA2, PA4, PA5,
PC15, PH0 and PH1
-5
I_INJ
Injected current on any other FT and FTf
pin
-5 ⁽¹⁾
Injected current on any other pin
-5 ⁽¹⁾
NA
0
mA
NA
+5
1. It is recommended to add a Schottky diode (pin to ground) to analog pins which may potentially inject
negative currents.
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