HCF4093_07 Datasheet, PDF (7/13 Pages) STMicroelectronics – QUAD 2-input NAND Schmidt trigger

HCF4093
Electrical characteristics
3.1
Dynamic electrical characteristics
)
Table 7.
Symbol
Dynamic electrical characteristics (T_amb = 25°C, C_L = 50 pF, R_L = 200 KΩ,
t_r = t_f = 20 ns)
Parameter
Test
Condition
Value (*)
Unit
V_DD
Min Typ Max
(V)
5
t_PLH t_PHL
Propagation delay time
10
15
5
190 380
90
180
ns
65
130
100 200
t_TLH t_THL
Output transition time
10
15
50
100
ns
40
80
(*) Typical temperature coefficient for all V_DD value is 0.3 %/°C.
Figure 3. Test circuit
1. C_L = 50 pF or equivalent (includes jig and probe capacitance)
2. R_L = 200 KΩ
3. R_T = Z_OUT of pulse generator (typically 50 Ω)
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